Development of a high-sensitivity array detector and fast digital data analysis system for coherent nanodiffractlon patterns
The spatial limits of conventional narrow beam analytical methods (XRD, SAD and CBED) are still large compared with the microstructural features which govern the properties of many materials. Recent technological advances in computer hardware and sensitive electron array detectors have made it feasible to examine the structure of subnanometer crystal volumes. By placing an extremely small diameter, coherent electron probe over the region of interest and digitally comparing the resultant 'nanodiffraction' pattern to a computer generated pattern which is based on dynamical diffraction in a model structure, it is possible to ascertain the local structure with a minimum of the subjectivity which is inherent in conventional operator interpretations of electron scattering intensities. This is especially important when very small beam diameters are involved, as the diffraction intensities are strongly dependent on crystal tilt and thickness, as well as the position of the beam relative to the unit cell origin.