Direct Measurement of Electron Drift Parameters using Depth Sensing Single Carrier CdZnTe Detectors

1997 ◽  
Vol 487 ◽  
Author(s):  
Z. He ◽  
G. F. Knoll ◽  
D. K. Wehe ◽  
Y. F. Du
Keyword(s):  
Drift Time ◽  
Wide Band ◽  
High Energy ◽  
Digital Data ◽  
Depth Sensing ◽  
Single Carrier ◽  
Analysis System ◽  
Cdznte Detectors ◽  
Data Analysis System ◽  
Carrier Charge

AbstractThis paper describes some novel techniques developed for directly measuring the electron mobility μe and mean free drift time Te in wide band gap semiconductors. These methods are based on a newly-developed digital data analysis system, in conjunction with single carrier charge sensing and depth sensing techniques. Compared with conventional methods, the new techniques are easier to implement, do not involve curve fitting, allow the use of high energy γ-rays and are not sensitive to variations in pulse rise time.

scholarly journals Evolution of the HEPS Jupyter-based remote data analysis System

2021 ◽  
Vol 251 ◽  
pp. 02046
Author(s):  
Zhibin Liu ◽  
Qiulan Huang ◽  
Haolai Tian ◽  
Yu Hu ◽  
Jingyan Shi ◽  
...  
Keyword(s):  
Data Analysis ◽  
Heterogeneous Computing ◽  
Data Access ◽  
High Energy ◽  
Work Efficiency ◽  
Process Data ◽  
Analysis System ◽  
Data Analysis System ◽  
Resource Scheduler ◽  
Remote Data

High Energy Photon Source(HEPS) Experiment is expected to produce large amount of data and have diverse computing requirements for data analysis. Generally, scientists need to spend several days to setup their experimental environment, which greatly reduce the scientists’ work efficiency. In response to the above problems, we introduce a remote data analysis system for HEPS. The system provides users a web-based interactive interface based Jupyter, which makes scientists are able to process data analysis anytime and anywhere. Particularly, we discuss the system architecture as well as the key points of this system. A solution of managing and scheduling heterogeneous computing resources (CPU and GPU) is proposed, which adopts Kubernetes to achieve centralized heterogeneous resources management and resource expansion on demand. An improved Kubernetes resource scheduler is discussed, which dispatches upper applications to nodes combining with the computing cluster status. The system can transparently and quickly deploy the data analysis environment for users in seconds and reach the maximum resource utilization. We also introduce an automated deployment solution to improve the work efficiency of developers and help deploy multidisciplinary applications faster and automatically. A unified certification is illustrated to make sure the security of remote data access and data analysis. Finally, we will show the running status of the system.

Development of a high-sensitivity array detector and fast digital data analysis system for coherent nanodiffractlon patterns

1989 ◽  
Vol 47 ◽  
pp. 496-497
Author(s):  
J. H. Butler ◽  
G. Y. Fan ◽  
J. M. Cowley ◽  
P. Rez
Keyword(s):  
Small Diameter ◽  
Region Of Interest ◽  
High Sensitivity ◽  
Digital Data ◽  
Computer Hardware ◽  
Array Detector ◽  
Technological Advances ◽  
Array Detectors ◽  
Analysis System ◽  
Data Analysis System

The spatial limits of conventional narrow beam analytical methods (XRD, SAD and CBED) are still large compared with the microstructural features which govern the properties of many materials. Recent technological advances in computer hardware and sensitive electron array detectors have made it feasible to examine the structure of subnanometer crystal volumes. By placing an extremely small diameter, coherent electron probe over the region of interest and digitally comparing the resultant 'nanodiffraction' pattern to a computer generated pattern which is based on dynamical diffraction in a model structure, it is possible to ascertain the local structure with a minimum of the subjectivity which is inherent in conventional operator interpretations of electron scattering intensities. This is especially important when very small beam diameters are involved, as the diffraction intensities are strongly dependent on crystal tilt and thickness, as well as the position of the beam relative to the unit cell origin.

Developmental Measurement of Mental Attention

1994 ◽  
Vol 17 (1) ◽  
pp. 161-200 ◽  
Author(s):  
Juan Pascual-Leone ◽  
Raymond Baillargeon
Keyword(s):  
Latent Class ◽  
Latent Class Models ◽  
Categorical Data Analysis ◽  
Test Items ◽  
Mental Demand ◽  
Mental Attention ◽  
Constructivist Model ◽  
Discrete Manner ◽  
Analysis System ◽  
Data Analysis System

A dialectical constructivist model of mental attention ("effort") and of working memory is briefly presented, and used to explicate subjects' processing in misleading test items. We illustrate with task analyses of the Figural Intersections Test (FIT). We semantically derive a set of 10 Theoretical Structural Predictions (TSP) that stipulate relations between mental attentional resources (mental-power: Mp) and the systematically varied mental demand of items (mental-demand: Md), as they jointly codetermine probable performance (conditional probabilities of passing and failing). These predictions are evaluated on first approximation using a known family of ordered Latent Class models, all probabilistic versions of Guttman's unidimensional scale. Parameters of these models were estimated using the Categorical Data Analysis System of Eliason (1990). Main results are: (1) Data fit Lazarsfeld's latent-distance model, providing initial support for our 10 predictions; (2) The M-power of children (latent Mp-classes) when assessed behaviourally may increase with age in a discrete manner, and have the potential to generate interval scales of measurement; (3) In the light of our results what statisticians often consider "error of measurement" appears (in part) to be signal, not noise: The organismic signal of misleading (Y-) processes that in their dialectical (trade-off) interaction with success-producing (X-) processes generate performance.

Integrated diagnostic and data analysis system of the C-2W advanced beam-driven field-reversed configuration plasma experiment

2018 ◽  
Vol 89 (10) ◽  
pp. 10K114 ◽  
Author(s):  
M. C. Thompson ◽  
T. M. Schindler ◽  
R. Mendoza ◽  
H. Gota ◽  
S. Putvinski ◽  
...  
Keyword(s):  
Data Analysis ◽  
Field Reversed Configuration ◽  
Plasma Experiment ◽  
Analysis System ◽  
Data Analysis System
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