An Interactive User Interface for Automated Acquisition of Transmission Electron Micrographs

2000 ◽  
Vol 6 (S2) ◽  
pp. 288-289
Author(s):  
J. Pulokas ◽  
N. Kisseberth ◽  
C.S. Potter ◽  
B. Carragher
Keyword(s):  
Electron Microscope ◽  
User Interface ◽  
Low Dose ◽  
Ccd Camera ◽  
Automated Control ◽  
Software Application ◽  
Transmission Electron ◽  
Set Up ◽  
Interactive User ◽  
Interactive User Interface

For several years we have been developing a software application, called Leginon, for the automated control and acquisition of images from a transmission electron microscope. The system has been developed around a Philips CM200 and a Gatan MSC CCD camera. One of the primary motivations in developing this software is to provide for a system that can acquire many hundreds of images under low dose conditions from a specimen embedded in vitreous ice. In order to set up and manage this system we have developed a number of simple interactive graphical tools that enable the user to design, oversee and manage protocols for controlling the microscope and collecting the images. Many of these simple tools have also proved generally useful as stand alone applications.

An Automated System for Maintaining Liquid Nitrogen Levels in the Gatan Cryostage.

2000 ◽  
Vol 6 (S2) ◽  
pp. 290-291
Author(s):  
S.J. Robinson ◽  
G. Fried ◽  
J. Pulokas
Keyword(s):  
Electron Microscope ◽  
Liquid Nitrogen ◽  
Transmission Electron Microscope ◽  
Ccd Camera ◽  
Automated System ◽  
Automated Control ◽  
Nitrogen Levels ◽  
Transmission Electron ◽  
Current Implementation

For several years we have been developing a system for the automated control and acquisition of images from a transmission electron microscope [1,2,3]. The system has been developed around a Philips CM200 equipped with a Gatan cryostage and a Gatan MSC CCD camera. One of the primary motivations in developing this software is to provide for a system that can acquire many hundreds of images over several days of completely unattended operation.The current implementation of our automated system allows data to be automatically collected from the TEM for more than 36 hours. There is no intervention required from the operator except for one critical exception, refilling the Gatan cryostage. The cryostage, which maintains the temperature of the vitreous ice specimens, must be refilled with liquid nitrogen (LN2) approximately every two hours.

Is Negative Staining Capable of High Resolution?

2001 ◽  
Vol 7 (S2) ◽  
pp. 360-361
Author(s):  
William H. Massover
Keyword(s):  
Electron Microscope ◽  
Electron Diffraction ◽  
Low Dose ◽  
Bovine Liver ◽  
Carbon Support ◽  
Negative Staining ◽  
Specimen Preparation ◽  
Transmission Electron ◽  
Bovine Liver Catalase ◽  
Set Up

Everyone presently answers “no” to this question, since this methodology for specimen preparation and preservation commonly is believed to be inherently limited to 20-25Å (2.0-2.5nm) resolution. Achievement of resolution levels smaller than this figure have been published only rarely. This report presents experimental evidence from electron diffraction showing that negative staining can preserve periodic protein structure to the level of at least 4Å.A suspension of bovine liver catalase crystals (orthorhombic: a= 69Å, b= 174Å, c= 206 Å [1]) is deposited on a hydrophilic carbon support and negatively stained using an on-grid protocol [2,3]. For low-dose electron diffraction with a JEOL 100CX transmission electron microscope (l00kV), the set-up for routine selected area diffraction is modified to keep the second condenser lens maximally overfocused; by a defocusing of the diffraction pattern, the grid can be surveyed and suitable thin single crystals centered in the diffraction aperture with only negligible irradiation.

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

ActorStudio: An interactive user interface editor

1993 ◽  
pp. 303-314
Author(s):  
Marja-Riitta Koivunen ◽  
Ora Lassila ◽  
Juha Ahvo ◽  
Minna Rankinen ◽  
Sirpa Riihiaho ◽  
...  
Keyword(s):  
User Interface ◽  
Interactive User ◽  
Interactive User Interface

Using the TEM Condenser Lens to Switch between Image and Diffraction Modes

2013 ◽  
Vol 21 (2) ◽  
pp. 40-40
Author(s):  
Lydia Rivaud
Keyword(s):  
Electron Microscope ◽  
Diffraction Pattern ◽  
Transmission Electron Microscope ◽  
Condenser Lens ◽  
Selected Area Diffraction Pattern ◽  
Transmission Electron ◽  
Set Up ◽  
Convergent Beam ◽  
Beam Diffraction ◽  
Convergent Beam Diffraction

Central to the operation of the transmission electron microscope (TEM) (when used with crystalline samples) is the ability to go back and forth between an image and a diffraction pattern. Although it is quite simple to go from the image to a convergent-beam diffraction pattern or from an image to a selected-area diffraction pattern (and back), I have found it useful to be able to go between image and diffraction pattern even more quickly. In the method described, once the microscope is set up, it is possible to go from image to diffraction pattern and back by turning just one knob. This makes many operations on the microscope much more convenient. It should be made clear that, in this method, neither the image nor the diffraction pattern is “ideal” (details below), but both are good enough for many necessary procedures.

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