scholarly journals Thin Film Thickness and Grain Structure Determination of Ferroelectric SrBi2Ta2O9 with Cross-Sectional Atomic Force Microscopy

2002 ◽  
Vol 8 (S02) ◽  
pp. 774-775
Author(s):  
D.L. Pechkis ◽  
C. Caragianis-Broadbridge ◽  
A.H. Lehman ◽  
K. L. Klein ◽  
J.-P. Han ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Film Thickness ◽  
Structure Determination ◽  
Grain Structure ◽  
Thin Film Thickness ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Atomic Force

Determination of hydration film thickness using atomic force microscopy

2005 ◽  
Vol 50 (4) ◽  
pp. 299-304 ◽  
Author(s):  
Changsheng Peng ◽  
Shaoxian Song ◽  
Qingbao Gu
Keyword(s):  
Atomic Force Microscopy ◽  
Film Thickness ◽  
Force Microscopy ◽  
Atomic Force

A HfO2 Thin Film Resistive Switch Based on Conducting Atomic Force Microscopy

2011 ◽  
Vol 14 (8) ◽  
pp. H311 ◽  
Author(s):  
J. Y. Son ◽  
D.-Y. Kim ◽  
H. Kim ◽  
W. J. Maeng ◽  
Y.-S. Shin ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Resistive Switch ◽  
Force Microscopy ◽  
Atomic Force
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