Determination of hydration film thickness using atomic force microscopy

Chinese Science Bulletin ◽

10.1360/04wb0130 ◽

2005 ◽

Vol 50 (4) ◽

pp. 299

Author(s):

Changsheng PENG

Keyword(s):

Atomic Force Microscopy ◽

Film Thickness ◽

Force Microscopy ◽

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Thin Film Thickness and Grain Structure Determination of Ferroelectric SrBi2Ta2O9 with Cross-Sectional Atomic Force Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927602106672 ◽

2002 ◽

Vol 8 (S02) ◽

pp. 774-775

Author(s):

D.L. Pechkis ◽

C. Caragianis-Broadbridge ◽

A.H. Lehman ◽

K. L. Klein ◽

J.-P. Han ◽

...

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Film Thickness ◽

Structure Determination ◽

Grain Structure ◽

Thin Film Thickness ◽

Cross Sectional ◽

Force Microscopy ◽

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Determination of hydration film thickness using atomic force microscopy

Chinese Science Bulletin ◽

10.1007/bf02897569 ◽

2005 ◽

Vol 50 (4) ◽

pp. 299-304 ◽

Author(s):

Changsheng Peng ◽

Shaoxian Song ◽

Qingbao Gu

Keyword(s):

Atomic Force Microscopy ◽

Film Thickness ◽

Force Microscopy ◽

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Determination of lubricant film thickness on a particulate disk surface by atomic force microscopy

IEEE Transactions on Magnetics ◽

10.1109/20.54003 ◽

1990 ◽

Vol 26 (3) ◽

pp. 1225-1228 ◽

Author(s):

C.M. Mate ◽

M.R. Lorenz ◽

V.J. Novotny

Keyword(s):

Atomic Force Microscopy ◽

Film Thickness ◽

Disk Surface ◽

Lubricant Film ◽

Lubricant Film Thickness ◽

Force Microscopy ◽

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Determination of near-surface forces in optical polishing using atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/5/2/002 ◽

1994 ◽

Vol 5 (2) ◽

pp. 70-79 ◽

Author(s):

M J Cumbo ◽

S D Jacobs

Keyword(s):

Atomic Force Microscopy ◽

Surface Forces ◽

Near Surface ◽

Force Microscopy ◽

Atomic Force ◽

Optical Polishing

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Experimental determination of the mechanical impedance of atomic force microscopy cantilevers in fluids up to 70 kHz

Journal of Applied Physics ◽

10.1063/1.1287522 ◽

2000 ◽

Vol 88 (5) ◽

pp. 2912-2920 ◽

Author(s):

Marc P. Scherer ◽

Gerhard Frank ◽

Anthony W. Gummer

Keyword(s):

Atomic Force Microscopy ◽

Experimental Determination ◽

Mechanical Impedance ◽

Force Microscopy ◽

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Determination of spatial resolution in atomic-force-microscopy-based electrical characterization techniques using quantum well structures

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1835317 ◽

2005 ◽

Vol 23 (1) ◽

pp. 61 ◽

Author(s):

O. Douhéret ◽

S. Bonsels ◽

S. Anand

Keyword(s):

Atomic Force Microscopy ◽

Quantum Well ◽

Spatial Resolution ◽

Electrical Characterization ◽

Quantum Well Structures ◽

Force Microscopy ◽

Characterization Techniques ◽

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Determination of electrostatic force and its characteristics based on phase difference by amplitude modulation atomic force microscopy

Nanoscale Research Letters ◽

10.1186/s11671-016-1765-2 ◽

2016 ◽

Vol 11 (1) ◽

Author(s):

Kesheng Wang ◽

Jia Cheng ◽

Shiji Yao ◽

Yijia Lu ◽

Linhong Ji ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Phase Difference ◽

Amplitude Modulation ◽

Electrostatic Force ◽

Force Microscopy ◽

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Determination of the surface area of annealed continuous gold film and pyrex glass in situ by the BET adsorption isotherm and ex situ by Atomic Force Microscopy in air

Applied Surface Science ◽

10.1016/s0169-4332(98)00297-9 ◽

1998 ◽

Vol 135 (1-4) ◽

pp. 8-14 ◽

Author(s):

L Stobiński ◽

L Zommer

Keyword(s):

Atomic Force Microscopy ◽

Adsorption Isotherm ◽

Surface Area ◽

Gold Film ◽

Ex Situ ◽

Pyrex Glass ◽

Force Microscopy ◽

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Determination of solid surface tension at the nano-scale using atomic force microscopy

Contact Angle, Wettability and Adhesion, Volume 4 ◽

10.1201/b12166-17 ◽

2006 ◽

pp. 249-276

Keyword(s):

Surface Tension ◽

Atomic Force Microscopy ◽

Solid Surface ◽

Force Microscopy ◽

Atomic Force ◽

Solid Surface Tension

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Determination of Microdomain Size in Langmuir-Blodgett Films of Binary Mixtures by IR Spectroscopy and Atomic Force Microscopy

Progress in Fourier Transform Spectroscopy ◽

10.1007/978-3-7091-6840-0_177 ◽

1997 ◽

pp. 683-685

Author(s):

Suci Widayati ◽

Richard A. Dluhy

Keyword(s):

Atomic Force Microscopy ◽

Ir Spectroscopy ◽

Binary Mixtures ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Atomic Force ◽

Langmuir Blodgett Films

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