Advantages of Simultaneous Imaging Using an Atomic Force Microscope Integrated with an Inverted Light Microscope
Atomic Force Microscopy (AFM) permits measurements on biological samples below the limits of light microscopy resolution under physiological environments and other controlled conditions. Consequently, AFM has become an increasingly valuable technique in cell biology. One of the most exciting advances in AFM instrumentation has been its integration with the light microscope. This permits investigators to take advantage of the power and utility of light microscopy and scanning probe microscopy simultaneously. In combining a light microscope with an AFM, scanner components must be specifically designed so that they do not adversely impact the light microscope's optical imaging capabilities. For example, an AFM-ILM (inverted light microscope) hybrid system should be fully compatible with the highest quality, off-the-shelf 0.50–0.55 NA numerical aperture (NA) OEM objectives and condensers.