Small-Angle X-ray Scattering Measurements and Image Reconstruction by the Maximum Entropy Method

1997 ◽  
Vol 69 (4) ◽  
pp. 794-800 ◽  
Author(s):  
Yuji Sasanuma ◽  
Robert V. Law ◽  
Yuji Kobayashi ◽  
Katsunari Sasaki
2007 ◽  
Vol 90 (19) ◽  
pp. 193122 ◽  
Author(s):  
Chengqing Wang ◽  
Ronald L. Jones ◽  
Eric K. Lin ◽  
Wen-Li Wu ◽  
Jim Leu

1999 ◽  
Vol 32 (6) ◽  
pp. 1069-1083 ◽  
Author(s):  
J. A. Elliott ◽  
S. Hanna

A model-independent maximum-entropy method is presented which will produce a structural model from small-angle X-ray diffraction data of disordered systems using no other prior information. In this respect, it differs from conventional maximum-entropy methods which assume the form of scattering entitiesa priori. The method is demonstrated using a number of different simulated diffraction patterns, and applied to real data obtained from perfluorinated ionomer membranes, in particular Nafion™, and a liquid crystalline copolymer of 1,4-oxybenzoate and 2,6-oxynaphthoate (B–N).


2012 ◽  
Vol 31 (2) ◽  
pp. 135-140 ◽  
Author(s):  
Trushar R. Patel ◽  
Raphael Reuten ◽  
Shawn Xiong ◽  
Markus Meier ◽  
Donald J. Winzor ◽  
...  

2007 ◽  
Vol 76 (1) ◽  
Author(s):  
L. B. Lurio ◽  
N. Mulders ◽  
M. Paetkau ◽  
M. H. W. Chan ◽  
S. G. J. Mochrie

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