A model-independent maximum-entropy method for the inversion of small-angle X-ray diffraction patterns
1999 ◽
Vol 32
(6)
◽
pp. 1069-1083
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Keyword(s):
X Ray
◽
A model-independent maximum-entropy method is presented which will produce a structural model from small-angle X-ray diffraction data of disordered systems using no other prior information. In this respect, it differs from conventional maximum-entropy methods which assume the form of scattering entitiesa priori. The method is demonstrated using a number of different simulated diffraction patterns, and applied to real data obtained from perfluorinated ionomer membranes, in particular Nafion™, and a liquid crystalline copolymer of 1,4-oxybenzoate and 2,6-oxynaphthoate (B–N).
2005 ◽
Vol 61
(a1)
◽
pp. c395-c396
Keyword(s):
1994 ◽
Vol 55
(9)
◽
pp. 809-814
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1993 ◽
Vol 54
(4)
◽
pp. 445-452
◽
2010 ◽
Vol 66
(2)
◽
pp. 130-140
◽
Keyword(s):
2001 ◽
Vol 57
(4)
◽
pp. 420-428
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Keyword(s):