Local Structure Investigations of Sequential Sorption of U and Fe on Polyacrylamide Hydroxamic Acid Resins

Author(s):  
Ashok Kumar Yadav ◽  
Sangita Pal ◽  
Sambhu Nath Jha ◽  
Dibyendu Bhattacharyya ◽  
Asis K. Adak ◽  
...  
2021 ◽  
pp. 126223
Author(s):  
H. Arima-Osonoi ◽  
K. Yamazaki ◽  
R. Simura ◽  
T. Sugawara ◽  
K. Yubuta ◽  
...  

2020 ◽  
Vol 103 (8) ◽  
pp. 4654-4663
Author(s):  
Satoru Yoshioka ◽  
Konosuke Tsuruta ◽  
Tomokazu Yamamoto ◽  
Kazuhiro Yasuda ◽  
Syo Matsumura ◽  
...  

2007 ◽  
Vol 131-133 ◽  
pp. 473-478
Author(s):  
Federico Boscherini ◽  
D. De Salvador ◽  
G. Bisognin ◽  
G. Ciatto

X-ray absorption fine structure can determine the local structure of most atoms in the periodic table. The great recent improvements in the performance of synchrotron radiation sources and techniques and advances in the simulations of the spectra have opened new opportunities, especially in the study of dilute systems in the soft X-ray range. In this contribution we will show some recent results that demonstrate how semiconductor physics may greatly benefit from such progress. In fact, doping or alloying of semiconductors with light elements, that have K absorption edges in the soft X-ray range, is widely employed to tune semiconductor properties. X-ray absorption fine structure investigations on such systems can give an important contribution towards the understanding and optimization of technological processes.


1996 ◽  
Vol 100 (9) ◽  
pp. 1593-1595 ◽  
Author(s):  
Wolfgang Seeber ◽  
Doris Ehrt

1985 ◽  
Vol 21 (1-4) ◽  
pp. 1-11 ◽  
Author(s):  
C. Natarajan ◽  
P.B. Abel ◽  
R.W. Hoffman

Author(s):  
G.E. Ice

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.


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