Tip-Induced Control of Charge and Molecular Bonding of Oxygen Atoms on the Rutile TiO2 (110) Surface with Atomic Force Microscopy

ACS Nano ◽  
2019 ◽  
Vol 13 (6) ◽  
pp. 6917-6924 ◽  
Author(s):  
Yuuki Adachi ◽  
Huan Fei Wen ◽  
Quanzhen Zhang ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Molecular Bonding ◽  
Oxygen Atoms

scholarly journals Characterization of individual molecular adsorption geometries by atomic force microscopy: Cu-TCPP on rutile TiO2 (110)

2015 ◽  
Vol 143 (9) ◽  
pp. 094202 ◽  
Author(s):  
Res Jöhr ◽  
Antoine Hinaut ◽  
Rémy Pawlak ◽  
Ali Sadeghi ◽  
Santanu Saha ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Adsorption ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of atomic step edges on the rutile TiO2(110)-(1 × 1) surface using atomic force microscopy

2018 ◽  
Vol 20 (44) ◽  
pp. 28331-28337 ◽  
Author(s):  
Huan Fei Wen ◽  
Masato Miyazaki ◽  
Quanzhen Zhang ◽  
Yuuki Adachi ◽  
Yan Jun Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Atomic Step ◽  
Atomic Configuration ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Step Edges

Clarifying the atomic configuration of step edges on a rutile TiO2 surface is crucial for understanding its fundamental reactivity, and the direct observation of atomic step edges is still a challenge.

Characterization and Reversible Migration of Subsurface Hydrogen on Rutile TiO2(110) by Atomic Force Microscopy at 78 K

2019 ◽  
Vol 123 (36) ◽  
pp. 22595-22602 ◽  
Author(s):  
Quanzhen Zhang ◽  
Huan Fei Wen ◽  
Yuuki Adachi ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

Electrical Engineering of the Oxygen Adatom and Vacancy on Rutile TiO2(110) by Atomic Force Microscopy at 78 K

2019 ◽  
Vol 123 (47) ◽  
pp. 28852-28858 ◽  
Author(s):  
Quanzhen Zhang ◽  
Huan Fei Wen ◽  
Yuuki Adachi ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Engineering ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

Identification of Atomic Defects and Adsorbate on Rutile TiO2(110)-(1 × 1) Surface by Atomic Force Microscopy

2019 ◽  
Vol 123 (42) ◽  
pp. 25756-25760 ◽  
Author(s):  
Huan Fei Wen ◽  
Yuuki Adachi ◽  
Quanzhen Zhang ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Elucidating the charge state of an Au nanocluster on the oxidized/reduced rutile TiO2 (110) surface using non-contact atomic force microscopy and Kelvin probe force microscopy

2020 ◽  
Vol 2 (6) ◽  
pp. 2371-2375 ◽  
Author(s):  
Yuuki Adachi ◽  
Huan Fei Wen ◽  
Quanzhen Zhang ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Charge State ◽  
High Vacuum ◽  
Kelvin Probe Force Microscopy ◽  
Ultra High Vacuum ◽  
Kelvin Probe ◽  
Au Nanoclusters ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

The charge state of Au nanoclusters on oxidized/reduced rutile TiO2 (110) surfaces were investigated by a combination of non-contact atomic force microscopy and Kelvin probe force microscopy at 78 K under ultra-high vacuum.

Electrically Induced Manipulation of the Au Nanoclusters on the Oxidized Rutile TiO2(110) Surface by Atomic Force Microscopy at 78 K

2020 ◽  
Vol 124 (52) ◽  
pp. 28562-28568
Author(s):  
Quanzhen Zhang ◽  
Huan Fei Wen ◽  
Rui Xu ◽  
Zhi Hai Cheng ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Au Nanoclusters ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force
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