Surface-Enhanced Light Emission from Single Hot Spots in Tollens Reaction Silver Nanoparticle Films: Linear versus Nonlinear Optical Excitation

2011 ◽  
Vol 115 (28) ◽  
pp. 13645-13659 ◽  
Author(s):  
Nicholas J. Borys ◽  
John M. Lupton
2021 ◽  
Author(s):  
Chigusa Matsumoto ◽  
Masao Gen ◽  
Atsushi Matsuki ◽  
Takafumi Seto

Abstract We report a spray-drying method to fabricate silver nanoparticle (AgNP) aggregates for application in surface-enhanced Raman spectroscopy (SERS). A custom-built system was used to fabricate AgNP aggregates of three sizes, 48, 86, and 218 nm, from drying droplets containing AgNPs atomized from an AgNP suspension. Sample solutions of Rhodamine B (RhB) at 10–6, 10–8, and 10–10 M concentrations were dropped onto the AgNP aggregates as probe molecules to examine the enhancement of the Raman signals of the RhB. The ordering of the analytical enhancement factors (AEFs) by aggregate size at a given RhB concentration was 86 nm > 218 nm > 48 nm. The AEFs of the 86 nm AgNP aggregates were higher than those of the 218-nm aggregates, although the 218-nm aggregates had more hot spots where Raman enhancement occurred. This finding was attributable to the deformation and damping of the electron cloud in the highly aggregated AgNPs, reducing the sensitivity for Raman enhancement. When RhB was premixed with the AgNP suspension prior to atomization, the AEFs at 10–8 M RhB rose ~100-fold compared to those in the earlier experiments (the post-dropping route). This significant enhancement was probably caused by the increased opportunity for the trapping of the probe molecules in the hot spots.


2019 ◽  
Vol 91 (8) ◽  
pp. 5316-5322 ◽  
Author(s):  
Yue-Jiao Zhang ◽  
Shu Chen ◽  
Petar Radjenovic ◽  
Nataraju Bodappa ◽  
Hua Zhang ◽  
...  

Author(s):  
M. Palaniappan ◽  
V. Ng ◽  
R. Heiderhoff ◽  
J.C.H. Phang ◽  
G.B.M. Fiege ◽  
...  

Abstract Light emission and heat generation of Si devices have become important in understanding physical phenomena in device degradation and breakdown mechanisms. This paper correlates the photon emission with the temperature distribution of a short channel nMOSFET. Investigations have been carried out to localize and characterize the hot spots using a spectroscopic photon emission microscope and a scanning thermal microscope. Frontside investigations have been carried out and are compared and discussed with backside investigations. A method has been developed to register the backside thermal image with the backside illuminated image.


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