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scholarly journals Design of a true HDR backside illuminated image sensor with charge domain binning

2021 ◽  
Author(s):  
Bart Dierickx ◽  
A. K. Kalgi ◽  
B. Sezgin ◽  
S. Oblan ◽  
K. Liekens ◽  
...  
Keyword(s):  
Image Sensor ◽  
Backside Illuminated

Backside-illuminated single photon avalanche diode with low dark count rate

2021 ◽  
Author(s):  
Tong Chu ◽  
Tianqi Zhao ◽  
Guilan Feng ◽  
Chunlan Lin ◽  
Jinlv Pan ◽  
...  
Keyword(s):  
Count Rate ◽  
Single Photon ◽  
Dark Count ◽  
Avalanche Diode ◽  
Dark Count Rate ◽  
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Simulation Study on a Backside-Illuminated Cascade-Collection-Gate Image Sensor

2021 ◽  
Author(s):  
Nguyen Hoai Ngo ◽  
Anh Quang Nguyen ◽  
Vu Truong Son Dao ◽  
Kazuhiro Shimonomura ◽  
Takeharu Goji Etoh
Keyword(s):  
Simulation Study ◽  
Image Sensor ◽  
Backside Illuminated

Displacement Damage Effects in Backside Illuminated CMOS Image Sensors

2021 ◽  
pp. 1-8
Author(s):  
Bingkai Liu ◽  
Yudong Li ◽  
Lin Wen ◽  
Jinghao Zhao ◽  
Dong Zhou ◽  
...  
Keyword(s):  
Image Sensors ◽  
Displacement Damage ◽  
Cmos Image Sensors ◽  
Backside Illuminated

Backside Illuminated “Ge-on-Si” NIR Camera

2021 ◽  
pp. 1-1
Author(s):  
Michael Oehme ◽  
Mathias Kaschel ◽  
Steffen Epple ◽  
Maurice Wanitzek ◽  
Zili Yu ◽  
...  
Keyword(s):  
Backside Illuminated

scholarly journals Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside‐Illuminated CMOS Image Sensors

2021 ◽  
Vol 30 (1) ◽  
pp. 180-184
Author(s):  
Liu Bingkai ◽  
Li Yudong ◽  
Wen Lin ◽  
Zhou Dong ◽  
Feng Jie ◽  
...  
Keyword(s):  
Neutron Irradiation ◽  
Image Sensors ◽  
Signal Degradation ◽  
Cmos Image Sensors ◽  
Dark Signal ◽  
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