scholarly journals High thermal stability and low power dissipation PCM with nanoscale oxygen‐doped SS thin film

2018 ◽  
Vol 12 (8) ◽  
pp. 1080-1083 ◽  
Author(s):  
Haipeng You ◽  
Yifeng Hu ◽  
Tianshu Lai ◽  
Qingqian Chou ◽  
Xiaoqin Zhu ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Stability ◽  
Low Power ◽  
Power Dissipation ◽  
High Thermal Stability ◽  
Low Power Dissipation

Low Power dissipation of Ring Counter using Dual sleep Transistor approach

2014 ◽  
Vol 4 (3) ◽  
pp. 9-13
Author(s):  
M. Balaji ◽  
◽  
B. Keerthana ◽  
K. Varun ◽  
◽  
...  
Keyword(s):  
Low Power ◽  
Power Dissipation ◽  
Ring Counter ◽  
Low Power Dissipation

scholarly journals Low-Power Dissipation 1060-nm VCSELs for Optical Interconnect

2015 ◽  
Vol 43 (7) ◽  
pp. 430
Author(s):  
Tomofumi KISE ◽  
Hitoshi SHIMIZU ◽  
Hideyuki NASU
Keyword(s):  
Low Power ◽  
Power Dissipation ◽  
Optical Interconnect ◽  
Low Power Dissipation

scholarly journals Investigation of reactively sputtered TaN thin-film resistors for microwave photonic applications

2021 ◽  
pp. 93-98
Author(s):  
Evgenii Erofeev ◽  
Egor Polyntsev ◽  
Sergei Ishutkin
Keyword(s):  
Thin Film ◽  
Thermal Stability ◽  
Magnetron Sputtering ◽  
Electrical Resistance ◽  
High Thermal Stability ◽  
Tantalum Nitride ◽  
Reactive Magnetron ◽  
Microwave Photonic ◽  
Thin Film Resistors ◽  
Thermal Stability Of

Electrophysical characteristics and their thermal stability of thin-film resistors based on tantalum nitride (TaN) obtained by reactive magnetron sputtering were investigated. The optimal modes of the magnetron sputtering process are determined, ensuring the Ta2N phase film composition with the value of the specific electrical resistance of 250 μm cm and high thermal stability of the parameters. On the basis of the investigations carried out, thin-film matching resistors were manufactured for use as part of an electro-optical InP-based MZ modulator

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