Non-equilibrium critical behavior of Heisenberg thin films
Keyword(s):
In this work we study the non-equilibrium properties of Heisenberg ferromagnetic films using Monte Carlo simulations by short-time dynamic method. By exploring the short-time scaling dynamics, we have found thickness dependency of critical exponents z, θ′ and β/v for ferromagnetic thin film. For calculating the critical exponents of ferromagnetic films we considered systems with linear size L = 128 and layers number N = 2; 4; 6; 10. Starting from initial configurations, the system was updated with Metropolis algorithm at the critical temperatures
2008 ◽
Vol 372
(47)
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pp. 7077-7080
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2006 ◽
Vol 17
(01)
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pp. 1-13
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2003 ◽
Vol 17
(05n06)
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pp. 209-218
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1970 ◽
Vol 28
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pp. 544-545
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1991 ◽
Vol 49
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pp. 1068-1069
1991 ◽
Vol 49
◽
pp. 1080-1081