Low−cost apparatus for the determination of the refractive index of thin dielectric films

1975 ◽  
Vol 46 (1) ◽  
pp. 48-49
Author(s):  
James J. Brady ◽  
Adolph L. Lewis
Keyword(s):  
Refractive Index ◽  
Low Cost ◽  
Dielectric Films ◽  
Thin Dielectric Films

ON THE DETERMINATION OF REFRACTIVE INDEX AND THICKNESS OF THIN DIELECTRIC FILMS FROM MEASUREMENT OF TRANSMITTANCE

2012 ◽  
Vol 19 (06) ◽  
pp. 1250059
Author(s):  
Z. H. SHAH ◽  
I. AHMAD ◽  
Q. A. TAHIR ◽  
E. E. KHAWAJA
Keyword(s):  
Refractive Index ◽  
Normal Incidence ◽  
Dielectric Films ◽  
Refractive Indices ◽  
Transparent Film ◽  
Transparent Substrate ◽  
Thin Dielectric Films

Refractive index and thickness of a transparent film (ZnS) on a transparent substrate (BK-7 glass) have been determined from measurement of normal incidence transmittance, using different methods. Some of the methods considered here are most widely used, as is apparent from the literature. The outcome of this study could help a researcher in selecting an appropriate method for such an application. The values of the refractive indices determined by different methods were found to be close to each other (within 0.5%). However, large (up to 4.4%) differences existed in the values of the thickness determined by different methods.

A Simplified Method for the Determination of the Refractive Index of Thin Dielectric Films

1989 ◽  
Vol 18 (1) ◽  
pp. 1-3
Author(s):  
A. Y. Morsy ◽  
S. S. Fouad ◽  
H. S. Metwally ◽  
A. M. Ebrahiem ◽  
A. S. Gerges
Keyword(s):  
Refractive Index ◽  
Dielectric Films ◽  
Simplified Method ◽  
Thin Dielectric Films

Determination of the optical constants (n, k) of thin dielectric films

1993 ◽  
Vol 32 (7) ◽  
pp. 1168 ◽  
Author(s):  
E. E. Khawaja ◽  
F. Bouamrane
Keyword(s):  
Optical Constants ◽  
Dielectric Films ◽  
Thin Dielectric Films

scholarly journals An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

2021 ◽  
Vol 21 (2) ◽  
pp. 61-66
Author(s):  
Erhan Tiryaki ◽  
Özlem Kocahan ◽  
Serhat Özder
Keyword(s):  
Refractive Index ◽  
Wavelet Transform ◽  
Continuous Wavelet Transform ◽  
Reflectance Spectrum ◽  
Dielectric Film ◽  
Dielectric Films ◽  
Continuous Wavelet ◽  
Improved Method ◽  
Refractive Index Dispersion

Abstract The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Continuous Wavelet Transform (CWT) and the refractive index dispersion was obtained by the mentioned method. In addition, a noisy reflectance spectrum was analyzed to show the advantages of the CWT method. Refractive index dispersions calculated by the Morlet and the Paul wavelet were compared to GMW at the end of the study.

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