ON THE DETERMINATION OF REFRACTIVE INDEX AND THICKNESS OF THIN DIELECTRIC FILMS FROM MEASUREMENT OF TRANSMITTANCE

2012 ◽  
Vol 19 (06) ◽  
pp. 1250059
Author(s):  
Z. H. SHAH ◽  
I. AHMAD ◽  
Q. A. TAHIR ◽  
E. E. KHAWAJA
Keyword(s):  
Refractive Index ◽  
Normal Incidence ◽  
Dielectric Films ◽  
Refractive Indices ◽  
Transparent Film ◽  
Transparent Substrate ◽  
Thin Dielectric Films

Refractive index and thickness of a transparent film (ZnS) on a transparent substrate (BK-7 glass) have been determined from measurement of normal incidence transmittance, using different methods. Some of the methods considered here are most widely used, as is apparent from the literature. The outcome of this study could help a researcher in selecting an appropriate method for such an application. The values of the refractive indices determined by different methods were found to be close to each other (within 0.5%). However, large (up to 4.4%) differences existed in the values of the thickness determined by different methods.

A Simplified Method for the Determination of the Refractive Index of Thin Dielectric Films

1989 ◽  
Vol 18 (1) ◽  
pp. 1-3
Author(s):  
A. Y. Morsy ◽  
S. S. Fouad ◽  
H. S. Metwally ◽  
A. M. Ebrahiem ◽  
A. S. Gerges
Keyword(s):  
Refractive Index ◽  
Dielectric Films ◽  
Simplified Method ◽  
Thin Dielectric Films

scholarly journals Refractive index evaluation of porous silicon using Bragg reflectors

2018 ◽  
Vol 64 (1) ◽  
pp. 72 ◽  
Author(s):  
D. Estrada-Wiese ◽  
J.A. Del Río
Keyword(s):  
Refractive Index ◽  
Porous Silicon ◽  
Simple Procedure ◽  
Merit Function ◽  
Refractive Indices ◽  
Bragg Reflectors ◽  
Photonic Bandgaps ◽  
Photonic Structures ◽  
Index Evaluation

There are two main physical properties needed to fabricate 1D photonic structures and form perfect photonic bandgaps: the quality of thethickness periodicity and the refractive index of their components. Porous silicon (PS) is a nano-structured material widely used to prepare 1Dphotonic crystals due to the ease of tuning its porosity and its refractive index by changing the fabrication conditions. Since the morphologyof PS changes with porosity, the determination of PS’s refractive index is no easy task. To find the optical properties of PS we can usedifferent effective medium approximations (EMA). In this work we propose a method to evaluate the performance of the refractive index ofPS layers to build photonic Bragg reflectors. Through a quality factor we measure the agreement between theory and experiment and thereinpropose a simple procedure to determine the usability of the refractive indices. We test the obtained refractive indices in more complicatedstructures, such as a broadband Vis-NIR mirror, and by means of a Merit function we find a good agreement between theory and experiment.With this study we have proposed quantitative parameters to evaluate the refractive index for PS Bragg reflectors. This procedure could havean impact on the design and fabrication of 1D photonic structures for different applications.

Refractive index measurements and order parameter determination of the liquid crystal p-ethoxybenzilidene-p-n-butylaniline

1981 ◽  
Vol 59 (4) ◽  
pp. 515-520 ◽  
Author(s):  
P. Palffy-Muhoray ◽  
D. A. Balzarini
Keyword(s):  
Refractive Index ◽  
Liquid Crystal ◽  
Order Parameter ◽  
Orientational Order ◽  
Parameter Determination ◽  
Refractive Indices ◽  
Temperature Changes ◽  
Interferometric Technique ◽  
Anisotropic Fluids

Using a simple new interferometric technique, the ordinary and extraordinary refractive indices of the nematic liquid crystal p-ethoxybenzilidene-p-n-butylaniline have been measured separately as a function of temperature. Changes in the refractive indices have been measured with an accuracy of ±0.005% and the absolute values with an accuracy of ±0.5%. Thermal expansivity data has been obtained by utilizing a specially constructed thermometer containing the sample. By using a recently developed Clausius–Mossotti relation for anisotropic fluids, the effective molecular polarizability and hence the orientational order parameter have been obtained from refractive index and density measurements as a function of temperature.

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