Intermittent contact scanning force microscopy: The role of the liquid necks

1998 ◽  
Vol 72 (26) ◽  
pp. 3461-3463 ◽  
Author(s):  
M. Luna ◽  
J. Colchero ◽  
A. M. Baró
Keyword(s):  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Intermittent Contact

Role of the force of friction on curved surfaces in scanning force microscopy

1995 ◽  
Vol 329 (1-2) ◽  
pp. 149-156 ◽  
Author(s):  
J.P Aimé ◽  
Z Elkaakour ◽  
S Gauthier ◽  
D Michel ◽  
T Bouhacina ◽  
...  
Keyword(s):  
Scanning Force Microscopy ◽  
Curved Surfaces ◽  
Force Microscopy ◽  
Scanning Force

scholarly journals Imaging Mechanisms in Dynamic Force Microscopy of Polymers

1999 ◽  
Vol 7 (5) ◽  
pp. 8-10
Author(s):  
Greg D. Haugstad
Keyword(s):  
Polymer Surface ◽  
Sample Pretreatment ◽  
Scanning Force Microscopy ◽  
Soft Materials ◽  
Dynamic Force ◽  
Force Microscopy ◽  
Mode Of Operation ◽  
Scanning Force ◽  
Intermittent Contact ◽  
Imaging Mechanisms

Applications of scanning force microscopy (SFM) in polymer studies have flourished in this decade, reflecting (a) sensitivity to both structure and properties on the nanometer scale, and (b) ease of operation in ambient environments without sample pretreatment. One drawback in SFM of soft materials has been damage incurred during the imaging process. The problem was alleviated by the development of dynamic force microscopy (DFM) in which the probe spends little or no time in contact with the polymer surface and shear forces are minimized. This mode of operation has been dubbed "tapping", "intermittent contact", "non-contact", "near-contact", etc. As studies proliferated, it became apparent that different researchers were using different terms to refer to the same apparent imaging mechanism, or the same term to refer to different imaging mechanisms.

Effect of Self-Assembling Monolayers (SAMs) on Ice Adhesion to Metals

1999 ◽  
Vol 586 ◽  
Author(s):  
S. L. Peng ◽  
V. F. Petrenko ◽  
M. Arakawa
Keyword(s):  
Contact Angle ◽  
Hydrogen Bonding ◽  
Molecular Layer ◽  
Scanning Force Microscopy ◽  
Original Method ◽  
Force Microscopy ◽  
Self Assembling ◽  
Scanning Force ◽  
Ice Adhesion

ABSTRACTIn this research we used an original method to study the role of hydrogen bonding in ice adhesion and to minimize the effect of this mechanism on ice adhesion. We coated metals (Au and Pt) with a mono-molecular layer of specific organic molecules that had either strong hydrophobic properties (CH3(CH2)11SH) or strong hydrophilic properties (OH(CH2)11SH). To determine the contribution of hydrogen bonding to ice adhesion, self-assembling monolayers (SAMs) of varying degrees of hydrophobicity/hydrophilicity were created by mixing the hydrophobic and hydrophilic components. All of the SAMs were composed of similar molecules that differed only in their outermost groups, OH- and CH3-. Thus, when the SAMs were grown on the same substrate (almost atomically smooth metal coatings), any differences in their adhesion to ice were due to differences in the hydrogen bonding between the ice and SAMs. The SAMs structure and quality were examined with scanning force microscopy (SFM) and the degree of the SAM's hydrophobicity/hydrophilicity was characterized by the contact angle of water on the monolayers. We then froze water on the SAMs and measured the shear strength of the ice/SAM/metal interfaces. Possible damage to the interfaces was examined with SFM after the ice had melted. We found a good correlation between the contact angle of water and the ice adhesion strength and determined the fraction of ice adhesion caused by hydrogen bonding.

Role of tip contamination in scanning force microscopy imaging of ionic surfaces

1997 ◽  
Vol 106 ◽  
pp. 425-442 ◽  
Author(s):  
Alexander I. Livshits ◽  
and Alexander L. Shluger
Keyword(s):  
Scanning Force Microscopy ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Scanning Force

Imaging Mechanisms in Dynamic Force Microscopy of Polymers

1999 ◽  
Vol 5 (S2) ◽  
pp. 990-991
Author(s):  
Greg D. Haugstad ◽  
Jon A. Hammerschmidt ◽  
Wayne L. Gladfelter
Keyword(s):  
Low Cost ◽  
Polymer Surface ◽  
Scanning Force Microscopy ◽  
Soft Materials ◽  
Sample Surface ◽  
Dynamic Force ◽  
Force Microscopy ◽  
Scanning Force ◽  
Intermittent Contact ◽  
Imaging Mechanisms

Applications of scanning force microscopy (SFM) in polymer studies have flourished in this decade, reflecting (a) the power of SFM to image both structure and propertiesdown to the nanometer scale, and (b) the low cost and ease of getting useful results in ambient environments. One difficulty in SFM of polymers has been damage incurred by soft materials during the imaging process. The problem was alleviated by the development of special dynamic modes of operation, in which the probe spends little or no time in contact with the polymer surface. Such modes were dubbed “tapping”, “intermittent-contact”, “non-contact”, “near-contact”, etc. As studies proliferated, it became apparent that different researchers were using different terms to refer to the same apparent imaging mechanism, or the same term to refer to different imaging mechanisms. This quandary derived from a poor understanding of exactly how the SFM probe interacts with the sample surface.1-3,5

The role of shear forces in scanning force microscopy: a comparison between the jumping mode and tapping mode

2000 ◽  
Vol 453 (1-3) ◽  
pp. 152-158 ◽  
Author(s):  
F. Moreno-Herrero ◽  
P.J. de Pablo ◽  
J. Colchero ◽  
J. Gómez-Herrero ◽  
A.M. Baró
Keyword(s):  
Scanning Force Microscopy ◽  
Shear Forces ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Scanning Force
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