Structure-film thickness relationship study of sputtered NiO∕Ni bilayers using depth profiling and atomic force microscopy techniques

2006 ◽  
Vol 99 (12) ◽  
pp. 124914 ◽  
Author(s):  
Brian Abbey ◽  
John D. Lipp ◽  
Zoe H. Barber ◽  
Trevor Rayment
Keyword(s):  
Atomic Force Microscopy ◽  
Film Thickness ◽  
Depth Profiling ◽  
Force Microscopy ◽  
Atomic Force ◽  
Relationship Study ◽  
Microscopy Techniques

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

Copper Diffusion Into Aluminum-Silicon Metallizations by Accelerated Thermal and Electrical Stressing

1996 ◽  
Vol 428 ◽  
Author(s):  
G. O. Ramseyer ◽  
L. H. Walsh ◽  
J. V. Beasock ◽  
H. F. Helbig ◽  
R. C. Lacoe ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Depth Profiling ◽  
Copper Diffusion ◽  
Force Microscopy ◽  
Atomic Force ◽  
Line Widths ◽  
Electromigration Lifetime

AbstractPatterned 930 nm Al(1%-Si) interconnects over 147 nm of Cu were electromigration lifetime tested at 1.0–1.5 × 105 A/cm2 at 250 °C. The morphology of the surfaces of the electromigrated stripes with different line widths and times to failure were characterized by atomic force microscopy, and changes in surface roughness were compared. The diffusion of copper into the electromigrated aluminum stripes was determined by depth profiling using Auger electron spectroscopy. In particular, areas where hillocks formed were examined and compared to areas of median roughness.

scholarly journals How did correlative atomic force microscopy and super-resolution microscopy evolve in the quest for unravelling enigmas in biology?

Nanoscale ◽  
2021 ◽  
Author(s):  
Adelaide Miranda ◽  
Ana I. Gómez-Varela ◽  
Andreas Stylianou ◽  
Liisa M. Hirvonen ◽  
Humberto Sánchez ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Super Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques ◽  
Super Resolution Microscopy ◽  
Detailed Picture

This review provides a detailed picture of the innovative efforts to combine atomic force microscopy and different super-resolution microscopy techniques to elucidate biological questions.

Using Atomic Force Microscopy to Retrieve Nanomechanical Surface Properties of Materials

2006 ◽  
Vol 514-516 ◽  
pp. 1598-1602 ◽  
Author(s):  
Sergio Graça ◽  
Rogerio Colaço ◽  
Rui Vilar
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Application Rate ◽  
Critical Parameters ◽  
Nanomechanical Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Properties Of Materials ◽  
Microscopy Techniques ◽  
Scratch Tests

When atomic force microscopy is used to retrieve nanomechanical surface properties of materials, unsuspected measurement and instrumentation errors may occur. In this work, some error sources are investigated and operating and correction procedures are proposed in order to maximize the accuracy of the measurements. Experiments were performed on sapphire, Ni, Co and Ni-30%Co samples. A triangular pyramidal diamond tip was used to perform indentation and scratch tests, as well as for surface visualization. It was found that nonlinearities of the z-piezo scanner, in particular the creep of the z-piezo, and errors in the determination of the real dimensions of tested areas, are critical parameters to be considered. However, it was observed that there is a critical load application rate, above which the influence of the creep of the z-piezo can be neglected. Also, it was observed that deconvolution of the tip geometry from the image of the tested area is essential to obtain accurate values of the dimensions of indentations and scratches. The application of these procedures enables minimizing the errors in nanomechanical property measurements using atomic force microscopy techniques.

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