Characterization of sputtered yttria‐stabilized zirconia thin film and its application to a metal‐insulator‐semiconductor structure
2007 ◽
Vol 436
(1-2)
◽
pp. 351-357
◽
2010 ◽
Vol 157
(7)
◽
pp. H727
◽
2012 ◽
pp. 265-272
◽
2001 ◽
Vol 184
(1-4)
◽
pp. 346-349
◽
Keyword(s):
2010 ◽
Vol 64
(22)
◽
pp. 2450-2453
◽
Keyword(s):
2014 ◽
Vol 122
(1421)
◽
pp. 72-77
◽
Keyword(s):
2012 ◽