scholarly journals Fabrication and characterization of (Ba, Sr)RuO3 ceramic targets and thin films for ferroelectric BaTiO3 thin-film capacitors

AIP Advances ◽  
2018 ◽  
Vol 8 (11) ◽  
pp. 115135
Author(s):  
Yuji Noguchi ◽  
Masaru Tada ◽  
Yuuki Kitanaka ◽  
Masaru Miyayama
Sensors ◽  
2020 ◽  
Vol 20 (5) ◽  
pp. 1532 ◽  
Author(s):  
Xianfeng Liang ◽  
Cunzheng Dong ◽  
Huaihao Chen ◽  
Jiawei Wang ◽  
Yuyi Wei ◽  
...  

Since the revival of multiferroic laminates with giant magnetoelectric (ME) coefficients, a variety of multifunctional ME devices, such as sensor, inductor, filter, antenna etc. have been developed. Magnetoelastic materials, which couple the magnetization and strain together, have recently attracted ever-increasing attention due to their key roles in ME applications. This review starts with a brief introduction to the early research efforts in the field of multiferroic materials and moves to the recent work on magnetoelectric coupling and their applications based on both bulk and thin-film materials. This is followed by sections summarizing historical works and solving the challenges specific to the fabrication and characterization of magnetoelastic materials with large magnetostriction constants. After presenting the magnetostrictive thin films and their static and dynamic properties, we review micro-electromechanical systems (MEMS) and bulk devices utilizing ME effect. Finally, some open questions and future application directions where the community could head for magnetoelastic materials will be discussed.


2014 ◽  
Vol 2 (43) ◽  
pp. 18463-18471 ◽  
Author(s):  
Kristin Bergum ◽  
Anna Magrasó ◽  
Helmer Fjellvåg ◽  
Ola Nilsen

Thin films of the proton conducting lanthanum tungstate phase, La28−xW4+xO54+δv2−δ, were fabricated by atomic layer deposition (ALD) and characterized by impedance spectroscopy.


Author(s):  
Nor Fazlina Mohd Lazim ◽  
Zaiki Awang ◽  
Sukreen Hana Herman ◽  
Uzer Mohd Nor ◽  
Mohd Nizam Osman ◽  
...  

1993 ◽  
Vol 43 (1-3) ◽  
pp. 103-110 ◽  
Author(s):  
J.B. Bates ◽  
N.J. Dudney ◽  
G.R. Gruzalski ◽  
R.A. Zuhr ◽  
A. Choudhury ◽  
...  

1985 ◽  
Vol 53 ◽  
Author(s):  
N. M. Johnson

ABSTRACTA review is presented on the application of electrical measurements to evaluate the existence and effects of residual electronic defects in crystallized—silicon thin films. Experimental techniques include current—voltage characterization, electronbeam—induced conductivity, transient—capacitance measurements on thin—film capacitors, transient—conductance spectroscopy on thin—film transistors, and photoconductivity.


1995 ◽  
Vol 259 (2) ◽  
pp. 218-224 ◽  
Author(s):  
Abdelkader Outzourhit ◽  
John U. Trefny ◽  
Tomoko Kito ◽  
Baki Yarar ◽  
Ali Naziripour ◽  
...  

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