High resolution monochromated X-ray photoelectron spectroscopy of organic polymers: A comparison between solid state data for organic polymers and gas phase data for small molecules

1992 ◽  
Vol 76 (4) ◽  
pp. 919-936 ◽  
Author(s):  
G. Beamson ◽  
D. Briggs
Keyword(s):  
Solid State ◽  
High Resolution ◽  
Small Molecules ◽  
Gas Phase ◽  
Photoelectron Spectroscopy ◽  
Organic Polymers ◽  
State Data ◽  
X Ray ◽  
Phase Data

The application of gas phase and solid state X-ray photoelectron spectroscopy to the investigation of derivatives containing the repeating SN unit

1980 ◽  
Vol 1 (2) ◽  
pp. 161-173 ◽  
Author(s):  
Patrick Brant ◽  
David C. Weber ◽  
Curtis T. Ewing ◽  
Forrest L. Carter ◽  
Joseph A. Hashmall
Keyword(s):  
Solid State ◽  
Gas Phase ◽  
Photoelectron Spectroscopy ◽  
X Ray

Decaphenylferrocene

1995 ◽  
Vol 48 (4) ◽  
pp. 851 ◽  
Author(s):  
LD Field ◽  
TW Hambley ◽  
PA Humphrey ◽  
CM Lindall ◽  
GJ Gainsford ◽  
...  
Keyword(s):  
Solid State ◽  
High Resolution ◽  
Vibrational Spectroscopy ◽  
Powder Diffraction ◽  
Photoelectron Spectroscopy ◽  
Mossbauer Spectroscopy ◽  
57Fe Mössbauer Spectroscopy ◽  
X Ray ◽  
57Fe Mössbauer ◽  
57Fe Mossbauer Spectroscopy

Decaphenylferrocene was obtained as an extremely insoluble, maroon microcrystalline solid by heating [(η5-C5Ph5)((η6-C6H5)C5Ph4)Fe], and was characterized by 57Fe Mossbauer spectroscopy, X-ray photoelectron spectroscopy, mass, electronic and vibrational spectroscopy, solid-state 13C n.m.r. spectroscopy and high-resolution X-ray powder diffraction, which showed it to be isostructural with decaphenylnickelocene.

The solid-state reaction of a functionalised polypyrrole; analysis using high resolution X-ray photoelectron spectroscopy

2004 ◽  
Vol 6 (9) ◽  
pp. 2403 ◽  
Author(s):  
J. M. Cooper ◽  
A. Glidle ◽  
A. R. Hillman ◽  
M. D. Ingram ◽  
C. Ryder ◽  
...  
Keyword(s):  
Solid State ◽  
High Resolution ◽  
Solid State Reaction ◽  
Photoelectron Spectroscopy ◽  
X Ray

High resolution x‐ray photoelectron spectroscopy study of Cr(CO)6in the gas phase

1992 ◽  
Vol 96 (12) ◽  
pp. 8770-8780 ◽  
Author(s):  
A. Nilsson ◽  
N. Mårtensson ◽  
S. Svensson ◽  
L. Karlsson ◽  
D. Nordfors ◽  
...  
Keyword(s):  
High Resolution ◽  
Gas Phase ◽  
Photoelectron Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray

scholarly journals PEAXIS: A RIXS and XPS Endstation for Solid-State Quantum and Energy Materials at BESSY II

2021 ◽  
Vol 7 ◽  
Author(s):  
Deniz Po Wong ◽  
Christian Schulz ◽  
Maciej Bartkowiak
Keyword(s):  
Electronic Structure ◽  
Solid State ◽  
High Resolution ◽  
Photoelectron Spectroscopy ◽  
Collective Excitations ◽  
Spectroscopic Techniques ◽  
Energy Materials ◽  
X Ray ◽  
X Ray Scattering ◽  
Sample Environment

PEAXIS (Photo Electron Analysis and resonant X-ray Inelastic Spectroscopy) is a dedicated endstation installed at the beamline U41-PEAXIS that offers high resolution soft X-ray spectroscopy measurements with incident photon energies ranging from 180 – 1600 eV. The endstation combines two X-ray spectroscopic techniques, X-ray photoelectron spectroscopy (XPS) and resonant inelastic soft X-ray scattering (RIXS), which are important for probing the electronic structure and local and collective excitations of solid-state materials. It features a continuous variation of scattering angle under UHV conditions for wave vector-resolved studies and a modular sample environment that allows investigation in the temperature range between 10 K and 1000 K.

29Si NMR and XPS Investigation of the Structure of Silicon Oxycarbide Glasses Derived from Polysiloxane Precursors

1994 ◽  
Vol 346 ◽  
Author(s):  
R.J.P. Corriu ◽  
D. Leclercq ◽  
P.H. Mutin ◽  
A. Vioux
Keyword(s):  
Solid State ◽  
Photoelectron Spectroscopy ◽  
Solid State Nmr ◽  
Random Distribution ◽  
Silicon Oxycarbide ◽  
29Si Nmr ◽  
Xps Spectra ◽  
Excess Carbon ◽  
X Ray ◽  
Silicon Oxycarbide Glasses

ABSTRACTTwo silicon oxycarbide glasses with different compositions (O/Si ratio 1.2 and 1.8) were prepared by pyrolysis at moderate temperature (900 °C) of polysiloxane precursors. Their structure was investigated using quantitative 29Si solid-state NMR and X-ray photoelectron spectroscopy (XPS). The environment of the silicon atoms in the oxycarbide phase corresponded to a purely random distribution of Si-O and Si-C bonds depending on the O/Si ratio of the glass only and not on the structure of the precursors. At the light of the NMR results, the Si2p XPS spectra of the glasses may be interpreted using the contribution of the five possible SiOxC4-x tetrahedra. The Cls spectra of these glasses indicated the presence of oxycarbide carbon in CSi4 tetrahedra, similar to carbide carbon, and graphitic-like excess carbon.

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