Development of a low-noise readout ASIC for Silicon Drift Detectors in high energy resolution X-ray spectrometry

2017 ◽  
Vol 12 (03) ◽  
pp. C03039-C03039 ◽  
Author(s):  
E. Atkin ◽  
V. Levin ◽  
E. Malankin ◽  
V. Shumikhin
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
Low Noise ◽  
High Energy Resolution ◽  
X Ray ◽  
Silicon Drift Detectors

scholarly journals High Energy Resolution X-Ray Spectrometer for High Count Rate Xrf Applications

1993 ◽  
Vol 37 ◽  
pp. 405-411
Author(s):  
C. S. Rossington ◽  
N. W. Madden ◽  
K. Chapman
Keyword(s):  
Energy Resolution ◽  
Count Rate ◽  
High Energy ◽  
Low Noise ◽  
High Energy Resolution ◽  
Photon Flux ◽  
Large Area ◽  
High Count ◽  
High Count Rate ◽  
X Ray

AbstractA new x-ray spectrometer has been constructed which incorporates a novel large area, low capacitance Si(Li) detector and a low noise JFET (junction field effect transistor) preamplifier. The spectrometer operates at high count Tates without the conventional compromise in energy resolution. For example, at an amplifier peaking time of 1 p.sec and a throughput count rate of 145,000 counts sec-1, the energy resolution at 5.9 keV is 220 eV FWHM. Commercially available spectrometers utilizing conventional geometry Si(Li) detectors with areas equivalent to the new detector have resolutions on the order of 540 eV under the same conditions. Conventional x-ray spectrometers offering high energy resolution must employ detectors with areas one-tenth the size of the new LBL detector (20 mm2 compared with 200 mm2). However, even with the use of the smaller area detectors, the energy resolution of a commercial system is typically limited to approximately 300 eV (again, at 1 μsec and 5.9 keV) due to the noise of the commercially available JFET's. The new large area detector is useful in high count rate applications, but is also useful in the detection of weak photon signals, in which it is desirable to subtend as large an angle of the available photon flux as possible, while still maintaining excellent energy resolution. X-ray fluorescence data from die new spectrometer is shown in comparison to a commercially available system in the analysis of a dilute muhi-element material, and also in conjunction with high count rate synchrotron EXAFS applications.

Microcalorimeter EDS: Benefits and Drawbacks

2000 ◽  
Vol 6 (S2) ◽  
pp. 738-739 ◽  
Author(s):  
D. A. Wollman ◽  
Dale E. Newbury ◽  
S. W. Nam ◽  
G. C. Hilton ◽  
K. D. Irwin ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
High Energy Resolution ◽  
Particle Analysis ◽  
High Count ◽  
X Ray ◽  
New Energy ◽  
Silicon Drift Detectors ◽  
Exciting Development ◽  
Commercial Introduction

The commercial introduction of high-count-rate, near-room-temperature silicon drift detectors (presently available) and high-energy-resolution cryogenic microcalorimeters (forthcoming) is an exciting development in x-ray microanalysis, in which detector choices and capabilities have been essentially stable for many years. Both of these new energy-dispersive detectors promise improved capabilities for specific applications, e.g., faster EDS mapping (silicon drift detectors) and nanoscale particle analysis (microcalorimeters). In this paper, we briefly examine some of the important benefits and drawbacks of microcalorimeter EDS (μcal EDS) for x-ray microanalysis.The primary benefit of μcal EDS over conventional semiconductor EDS is the factor of ∼ 20 improvement in energy resolution (∼ 4 eV, real-time analog signal processing), as shown in Figure 1.

scholarly journals High-Energy-Resolution Fluorescence-Detected X-ray Absorption of the Q Intermediate of Soluble Methane Monooxygenase

2017 ◽  
Vol 139 (49) ◽  
pp. 18024-18033 ◽  
Author(s):  
Rebeca G. Castillo ◽  
Rahul Banerjee ◽  
Caleb J. Allpress ◽  
Gregory T. Rohde ◽  
Eckhard Bill ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Methane Monooxygenase ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray ◽  
Soluble Methane Monooxygenase ◽  
X Ray Absorption

scholarly journals High-energy resolution X-ray absorption and emission spectroscopy reveals insight into unique selectivity of La-based nanoparticles for CO2

2015 ◽  
Vol 112 (52) ◽  
pp. 15803-15808 ◽  
Author(s):  
Ofer Hirsch ◽  
Kristina O. Kvashnina ◽  
Li Luo ◽  
Martin J. Süess ◽  
Pieter Glatzel ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Emission Spectroscopy ◽  
High Energy ◽  
Unit Cell ◽  
High Energy Resolution ◽  
Electron Configuration ◽  
Edge Structure ◽  
X Ray ◽  
X Ray Absorption

The lanthanum-based materials, due to their layered structure and f-electron configuration, are relevant for electrochemical application. Particularly, La2O2CO3 shows a prominent chemoresistive response to CO2. However, surprisingly less is known about its atomic and electronic structure and electrochemically significant sites and therefore, its structure–functions relationships have yet to be established. Here we determine the position of the different constituents within the unit cell of monoclinic La2O2CO3 and use this information to interpret in situ high-energy resolution fluorescence-detected (HERFD) X-ray absorption near-edge structure (XANES) and valence-to-core X-ray emission spectroscopy (vtc XES). Compared with La(OH)3 or previously known hexagonal La2O2CO3 structures, La in the monoclinic unit cell has a much lower number of neighboring oxygen atoms, which is manifested in the whiteline broadening in XANES spectra. Such a superior sensitivity to subtle changes is given by HERFD method, which is essential for in situ studying of the interaction with CO2. Here, we study La2O2CO3-based sensors in real operando conditions at 250 °C in the presence of oxygen and water vapors. We identify that the distribution of unoccupied La d-states and occupied O p- and La d-states changes during CO2 chemoresistive sensing of La2O2CO3. The correlation between these spectroscopic findings with electrical resistance measurements leads to a more comprehensive understanding of the selective adsorption at La site and may enable the design of new materials for CO2 electrochemical applications.

scholarly journals Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution

2013 ◽  
Vol 19 (S2) ◽  
pp. 1258-1259 ◽  
Author(s):  
H. Takahashi ◽  
N. Handa ◽  
T. Murano ◽  
M. Terauchi ◽  
M. Koike ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
Chemical State ◽  
High Energy Resolution ◽  
X Rays ◽  
X Ray

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

X‐ray fluorescence analysis with high energy resolution

1996 ◽  
Vol 67 (9) ◽  
pp. 3359-3359 ◽  
Author(s):  
Wolfgang A. Caliebe ◽  
Sas̆a Bajt ◽  
Chi‐Chang Kao
Keyword(s):  
Energy Resolution ◽  
Fluorescence Analysis ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray

High energy resolution PIXE spectroscopy at the J. Stefan Institute, Ljubljana

2014 ◽  
Vol 24 (03n04) ◽  
pp. 205-215
Author(s):  
M. Kavčič
Keyword(s):  
Trace Element ◽  
Energy Resolution ◽  
Trace Element Analysis ◽  
High Energy ◽  
Energy Dispersive ◽  
High Energy Resolution ◽  
Pixe Analysis ◽  
X Ray ◽  
Analytical Technique ◽  
Stefan Institute

While traditional proton induced X-ray emission (PIXE) analytical technique is based on the energy dispersive solid state detectors used to collect the X-ray fluorescence from the sample, wavelength dispersive X-ray (WDX) spectrometers are applied in high energy resolution PIXE (HR-PIXE) analysis. The main drawback of the WDX spectroscopy is the relatively low efficiency making it less applicable for trace element PIXE analysis. However, the efficiency was enhanced significantly in modern spectrometers employing cylindrically or even spherically curved crystals combined with position sensitive X-ray detectors. The energy resolution of such a spectrometer may exceed the resolution of the energy dispersive detector by two orders of magnitude while keeping the efficiency at a high enough level to perform trace element analysis. In this paper, the recent history and the development of HR-PIXE spectroscopy at the J. Stefan Institute in Ljubljana is presented. Our current setup based on in-vacuum Johansson-type crystal spectrometer is presented in more details followed by some most recent applications.

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