scholarly journals Extreme ultraviolet and visible spectroscopy of promethiumlike heavy ions

2015 ◽  
Vol 92 (2) ◽  
Author(s):  
Yusuke Kobayashi ◽  
Kai Kubota ◽  
Kazuki Omote ◽  
Akihiro Komatsu ◽  
Junpei Sakoda ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Extreme Ultraviolet ◽  
Visible Spectroscopy

First solar electron events observed by EPD aboard Solar Orbiter

2021 ◽  
Author(s):  
Raúl Gómez-Herrero ◽  
Daniel Pacheco ◽  
Alexander Kollhoff ◽  
Francisco Espinosa Lara ◽  
Johan L. Freiherr von Forstner ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Extreme Ultraviolet ◽  
Transport Processes ◽  
Relativistic Electrons ◽  
Radio Bursts ◽  
Solar Origin ◽  
Time Profiles ◽  
Field Environment ◽  
Multiple Spacecraft ◽  
Excellent Energy Resolution

<p>The first solar electron events detected by Solar Orbiter were observed by the Energetic Particle Detector (EPD) suite during July 11-23, 2020, when the spacecraft was at heliocentric distances between 0.61 and 0.69 au. We combined EPD electron observations from 4 keV to the relativistic range (few MeV), radio dynamic spectra and extreme ultraviolet (EUV) observations from multiple spacecraft in order to identify the solar origin of these electron events. Electron anisotropies and timing as well as the plasma and magnetic field environment were evaluated to characterize the interplanetary transport conditions. We found that all the electron events were clearly associated with type III radio bursts. EUV jets were also found in association with all of them except one. A diversity of time profiles and pitch-angle distributions (ranging from almost isotropic to beam-like) was observed. These observations indicate that different source locations and different magnetic connectivity and transport conditions were likely involved. The broad spectral range covered by EPD with excellent energy resolution and the high time cadence ensure that future observations close to the Sun will contribute to the understanding of the acceleration, release, and transport processes of energetic particles. EPD observations will play a key role in the identification of the sources of impulsive events and the links between the near-relativistic electrons and the ion populations enriched in <sup>3</sup>He and heavy ions</p><p> </p>

Accurate wavelengths of resonance lines in Zn-like heavy ions

2003 ◽  
Vol 81 (7) ◽  
pp. 911-918 ◽  
Author(s):  
S B Utter ◽  
P Beiersdorfer ◽  
E Träbert
Keyword(s):  
Electron Beam ◽  
Heavy Ions ◽  
Ion Trap ◽  
Extreme Ultraviolet ◽  
Electron Beam Ion Trap ◽  
Flat Field ◽  
Improved Accuracy

Using an electron-beam ion trap and a flat-field spectrometer, the extreme ultraviolet resonance lines of Zn-like ions of Yb, W, Au, Pb, Th, and U were observed and their wavelengths measured with greatly improved accuracy. The results are compared to those from laser-produced plasmas and to theory, and significant differences are found. PACS Nos.: 32.30.Jc, 39.30.+w

scholarly journals Extreme ultraviolet spectroscopy and atomic models of highly charged heavy ions in the Large Helical Device

2016 ◽  
Vol 59 (1) ◽  
pp. 014009 ◽  
Author(s):  
C Suzuki ◽  
I Murakami ◽  
F Koike ◽  
N Tamura ◽  
H A Sakaue ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Extreme Ultraviolet ◽  
Ultraviolet Spectroscopy ◽  
Atomic Models

Specimen Preparation of Near Surface Ion Irradiated Samples

1985 ◽  
Vol 43 ◽  
pp. 170-171
Author(s):  
K. F. Russell ◽  
L. L. Horton
Keyword(s):  
Radiation Damage ◽  
Heavy Ions ◽  
Target Material ◽  
Metal Alloys ◽  
Specimen Surface ◽  
Specimen Preparation ◽  
Particle Accelerators ◽  
Near Surface ◽  
Graaff Accelerator ◽  
Van De Graaff

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.

THERMAL MODEL FOR THE DESORPTION OF (MOLECULAR) IONS INDUCED BY MeV HEAVY IONS

1989 ◽  
Vol 50 (C2) ◽  
pp. C2-237-C2-243 ◽  
Author(s):  
H. VOIT ◽  
E. NIESCHLER ◽  
B. NEES ◽  
R. SCHMIDT ◽  
CH. SCHOPPMANN ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Thermal Model ◽  
Molecular Ions

Theory of electronic stopping of heavy ions in metals

1979 ◽  
Vol 129 (10) ◽  
pp. 239 ◽  
Author(s):  
I.A. Akhiezer ◽  
L.N. Davidov
Keyword(s):  
Heavy Ions

Plasma-based sources of extreme ultraviolet radiation for lithography and mask inspection

2018 ◽  
Vol 189 (03) ◽  
pp. 323-334 ◽  
Author(s):  
D.B. Abramenko ◽  
P.S. Antsiferov ◽  
D.I. Astakhov ◽  
Aleksandr Yu. Vinokhodov ◽  
Il'ya Yu. Vichev ◽  
...  
Keyword(s):  
Ultraviolet Radiation ◽  
Extreme Ultraviolet ◽  
Mask Inspection ◽  
Extreme Ultraviolet Radiation
Sign in / Sign up

Export Citation Format

Share Document