Delocalized Wigner lattice on a dielectric layer with a metallic substrate: Dynamical properties and phase transitions

The study of dynamical properties of crystals near structural phase transitions is still of great importance. Especially the interest on ultralow-frequency dynamics, i.e. the so called “Central-Peak question” was renewed nowadays through some recent work on the observation of Entropy Fluctuations in macroscopic susceptibilities. This so called Heat-Diffusion Central Peak was previously found in scattering experiments, and the corresponding theory was originally formulated for scattering experiments. In this work we present an overview on previous light scattering measurements of Entropy Fluctuations and very recent results concerning the observation of a Heat-Diffusion Central Peak in macroscopic properties at ultralow frequencies, which provide a new insight into the “old” Central Peak problem. The crossover functions from isothermal to adiabatic behaviour are calculated for the macroscopic susceptibilities.

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Reversible oxygen migration and phase transitions in hafnia-based ferroelectric devices

Science ◽

10.1126/science.abf3789 ◽

2021 ◽

pp. eabf3789

Author(s):

Pavan Nukala ◽

Majid Ahmadi ◽

Yingfen Wei ◽

Sytze de Graaf ◽

Evgenios Stylianidis ◽

...

Keyword(s):

Thin Films ◽

Phase Transitions ◽

Dielectric Layer ◽

Atomic Resolution ◽

Exact Nature ◽

Oxygen Imaging ◽

Oxygen Migration ◽

Source Sink ◽

Source And Sink

Unconventional ferroelectricity exhibited by hafnia-based thin films, robust at nanoscale sizes, presents tremendous opportunities in nanoelectronics. However, the exact nature of polarization switching remains controversial. We investigated La0.67Sr0.33MnO3/Hf0.5Zr0.5O2 capacitor interfaced with various top electrodes while in situ electrical biasing using atomic resolution microscopy with direct oxygen imaging, as well as synchrotron nanobeam diffraction. When the top electrode is oxygen reactive, we clearly show reversible oxygen vacancy migration with electrodes being the source and sink of oxygen, and the dielectric layer acting as a fast conduit at millisecond timescales. With non-reactive top electrodes and at longer time scales (seconds), the dielectric layer also acts as an oxygen source/sink. Our results show that ferroelectricity in hafnia-based thin films is unmistakably intertwined to oxygen voltammetry.

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From the Oort cloud to Halley-type comets

International Astronomical Union Colloquium ◽

10.1017/s0252921100031638 ◽

1999 ◽

Vol 173 ◽

pp. 327-338 ◽

Cited By ~ 5

Author(s):

J.A. Fernández ◽

T. Gallardo

Keyword(s):

Total Population ◽

Complex Function ◽

Dynamical Evolution ◽

Oort Cloud ◽

Capture Process ◽

Influx Rate ◽

Short Period ◽

Dynamical Properties ◽

Orbital Periods ◽

Probability Of Capture

AbstractThe Oort cloud probably is the source of Halley-type (HT) comets and perhaps of some Jupiter-family (JF) comets. The process of capture of Oort cloud comets into HT comets by planetary perturbations and its efficiency are very important problems in comet ary dynamics. A small fraction of comets coming from the Oort cloud − of about 10−2− are found to become HT comets (orbital periods < 200 yr). The steady-state population of HT comets is a complex function of the influx rate of new comets, the probability of capture and their physical lifetimes. From the discovery rate of active HT comets, their total population can be estimated to be of a few hundreds for perihelion distancesq <2 AU. Randomly-oriented LP comets captured into short-period orbits (orbital periods < 20 yr) show dynamical properties that do not match the observed properties of JF comets, in particular the distribution of their orbital inclinations, so Oort cloud comets can be ruled out as a suitable source for most JF comets. The scope of this presentation is to review the capture process of new comets into HT and short-period orbits, including the possibility that some of them may become sungrazers during their dynamical evolution.

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Electron Microscopy of Graphite Intercalation Compounds

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100055564 ◽

1982 ◽

Vol 40 ◽

pp. 544-545

Author(s):

G. Timp ◽

L. Salamanca-Riba ◽

L.W. Hobbs ◽

G. Dresselhaus ◽

M.S. Dresselhaus

Keyword(s):

Electron Microscopy ◽

Phase Transitions ◽

Domain Wall ◽

Intercalation Compounds ◽

Lattice Plane ◽

Wall Model ◽

Graphite Intercalation Compounds ◽

Fundamental Symmetry ◽

Graphite Intercalation

Electron microscopy can be used to study structures and phase transitions occurring in graphite intercalations compounds. The fundamental symmetry in graphite intercalation compounds is the staging periodicity whereby each intercalate layer is separated by n graphite layers, n denoting the stage index. The currently accepted model for intercalation proposed by Herold and Daumas assumes that the sample contains equal amounts of intercalant between any two graphite layers and staged regions are confined to domains. Specifically, in a stage 2 compound, the Herold-Daumas domain wall model predicts a pleated lattice plane structure.

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Multiple phase transitions investigated by high-speed TEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100175880 ◽

1990 ◽

Vol 48 (4) ◽

pp. 550-551

Author(s):

Oleg Bostanjoglo ◽

Peter Thomsen-Schmidt

Keyword(s):

Phase Transitions ◽

High Speed ◽

Short Exposure ◽

Semiconductor Film ◽

Time Resolved ◽

Short Exposure Time ◽

Multiple Phase ◽

Model Substance ◽

History Of ◽

Electron Image

Thin GexTe1-x (x = 0.15-0.8) were studied as a model substance of a composite semiconductor film, in addition being of interest for optical storage material. Two complementary modes of time-resolved TEM were used to trace the phase transitions, induced by an attached Q-switched (50 ns FWHM) and frequency doubled (532 nm) Nd:YAG laser. The laser radiation was focused onto the specimen within the TEM to a 20 μm spot (FWHM). Discrete intermediate states were visualized by short-exposure time doubleframe imaging /1,2/. The full history of a transformation was gained by tracking the electron image intensity with photomultiplier and storage oscilloscopes (space/time resolution 100 nm/3 ns) /3/. In order to avoid radiation damage by the probing electron beam to detector and specimen, the beam is pulsed in this continuous mode of time-resolved TEM,too.Short events ( <2 μs) are followed by illuminating with an extended single electron pulse (fig. 1c)

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