High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector

2012 ◽  
Vol 20 (1) ◽  
pp. 153-159 ◽  
Author(s):  
Patrik Vagovič ◽  
Dušan Korytár ◽  
Angelica Cecilia ◽  
Elias Hamann ◽  
Libor Švéda ◽  
...  
Keyword(s):  
High Resolution ◽  
Spatial Resolution ◽  
High Efficiency ◽  
Imaging System ◽  
Single Photon ◽  
Signal To Noise Ratio ◽  
Photon Counting ◽  
Full Field ◽  
X Ray ◽  
X Ray Imaging

The performance of a recently developed full-field X-ray micro-imaging system based on an in-line Bragg magnifier is reported. The system is composed of quasi-channel-cut crystals in combination with a Medipix single-photon-counting detector. A theoretical and experimental study of the imaging performance of the crystals–detector combination and a comparison with a standard indirect detector typically used in high-resolution X-ray imaging schemes are reported. The spatial resolution attained by our system is about 0.75 µm, limited only by the current magnification. Compared with an indirect detector system, this system features a better efficiency, signal-to-noise ratio and spatial resolution. The optimal working resolution range of this system is between ∼0.4 µm and 1 µm, filling the gap between transmission X-ray microscopes and indirect detectors. Applications for coherent full-field imaging of weakly absorbing samples are shown and discussed.

Single photon counting x-ray imaging system using a micro hole and strip plate

2007 ◽  
Author(s):  
Hugo Natal da Luz ◽  
Carlos A. B. Oliveira ◽  
Carlos D. R. Azevedo ◽  
Jamil A. Mir ◽  
Joaquim M. F. dos Santos ◽  
...  
Keyword(s):  
Imaging System ◽  
Single Photon ◽  
Photon Counting ◽  
Single Photon Counting ◽  
X Ray ◽  
X Ray Imaging ◽  
Micro Hole ◽  
Strip Plate

Single Photon Counting X-Ray Imaging System Using a Micro Hole and Strip Plate

2008 ◽  
Vol 55 (4) ◽  
pp. 2341-2345 ◽  
Author(s):  
Hugo Natal da Luz ◽  
Carlos A. B. Oliveira ◽  
Carlos D. R. Azevedo ◽  
Jamil A. Mir ◽  
Rui de Oliveira ◽  
...  
Keyword(s):  
Imaging System ◽  
Single Photon ◽  
Photon Counting ◽  
Single Photon Counting ◽  
X Ray ◽  
X Ray Imaging ◽  
Micro Hole ◽  
Strip Plate

scholarly journals ZnWO4 Nanoparticle Scintillators for High Resolution X-ray Imaging

Nanomaterials ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 1721
Author(s):  
Heon Yong Jeong ◽  
Hyung San Lim ◽  
Ju Hyuk Lee ◽  
Jun Heo ◽  
Hyun Nam Kim ◽  
...  
Keyword(s):  
Particle Size ◽  
Zinc Oxide ◽  
High Resolution ◽  
Tungsten Oxide ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
X Ray ◽  
X Ray Imaging ◽  
Average Size ◽  
And Tungsten

The effect of scintillator particle size on high-resolution X-ray imaging was studied using zinc tungstate (ZnWO4) particles. The ZnWO4 particles were fabricated through a solid-state reaction between zinc oxide and tungsten oxide at various temperatures, producing particles with average sizes of 176.4 nm, 626.7 nm, and 2.127 μm; the zinc oxide and tungsten oxide were created using anodization. The spatial resolutions of high-resolution X-ray images, obtained from utilizing the fabricated particles, were determined: particles with the average size of 176.4 nm produced the highest spatial resolution. The results demonstrate that high spatial resolution can be obtained from ZnWO4 nanoparticle scintillators that minimize optical diffusion by having a particle size that is smaller than the emission wavelength.

Evaluation of a photon counting X-ray imaging system

2002 ◽  
Author(s):  
M. Lundqvist ◽  
B. Cederstrom ◽  
V. Chmill ◽  
M. Danielsson ◽  
B. Hasegawa
Keyword(s):  
Imaging System ◽  
Photon Counting ◽  
X Ray ◽  
X Ray Imaging

X-ray imaging of moving objects using on-chip TDI and MDX methods with single photon counting CdTe hybrid pixel detector

2021 ◽  
Vol 16 (12) ◽  
pp. C12014
Author(s):  
M. Zoladz ◽  
P. Grybos ◽  
R. Szczygiel
Keyword(s):  
Moving Objects ◽  
Single Photon ◽  
Photon Counting ◽  
Two Dimensional ◽  
Single Photon Counting ◽  
X Ray ◽  
X Ray Imaging ◽  
On Chip ◽  
Pixel Matrix ◽  
Single Pixel

Abstract X-ray imaging of moving objects using line detectors remains the most popular method of object content and structure examination with a typical resolution limited to 0.4–1 mm. Higher resolutions are difficult to obtain as, for the detector in the form of a single pixel row, the narrower the detector is, the lower the image Signal to Noise Ratio (SNR). This is because, for smaller pixel sizes, fewer photons hit the pixel in each time unit for a given radiation intensity. To overcome the trade-off between the SNR and spatial resolution, a two-dimensional sensor, namely a pixel matrix can be used. Imaging of moving objects with a pixel matrix requires time-domain integration (TDI). Straightforward TDI implementation is based on the proper accumulation of images acquired during consecutive phases of an object’s movement. Unfortunately, this method is much more demanding regarding data transfer and processing. Data from the whole pixel matrix instead of a single pixel row must be transferred out of the chip and then processed. The alternative approach is on-chip TDI implementation. It takes advantage of photons acquired by multiple rows (a higher SNR), but generates similar data amount as a single pixel row and does not require data processing out of the chip. In this paper, on-chip TDI is described and verified by using a single photon counting two-dimensional (a matrix of 128 × 192 pixels) CdTe hybrid X-ray detector with the 100 µm × 100 µm pixel size with up to four energy thresholds per pixel. Spatial resolution verification is combined with the Material Discrimination X-ray (MDX) imaging method.

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