An analytical back gate bias dependent threshold voltage model for SiGe-channel ultrathin SOI PMOS devices
1993 ◽
Vol 40
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pp. 2237-2244
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2016 ◽
Vol 45
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1995 ◽
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1993 ◽
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2000 ◽
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1999 ◽
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1999 ◽
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2015 ◽
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