A high-resolution multibit Sigma Delta ADC with digital correction and relaxed amplifier requirements

1993 ◽  
Vol 28 (6) ◽  
pp. 648-660 ◽  
Author(s):  
M. Sarhang-Nejad ◽  
G.C. Temes
2010 ◽  
Vol 45 (6) ◽  
pp. 1099-1110 ◽  
Author(s):  
Ali Agah ◽  
Katelijn Vleugels ◽  
Peter B. Griffin ◽  
Mostafa Ronaghi ◽  
James D. Plummer ◽  
...  

2013 ◽  
Vol 333-335 ◽  
pp. 1669-1672
Author(s):  
Cheng Huang ◽  
You Hui Li ◽  
Ya Dan Zhang ◽  
Nan Wang

The main challenges of high-resolution ADC testing are the huge number of samples and the expensive test equipment, especially the requirement of high linearity signal source. In this paper, the scaling and segmentation algorithm which combines SEIR with windows is introduced for high-resolution ADC test. The new approach is validated by simulation with a 24-bit sigma-delta ADC. INL error of the proposed method is ±0.2LSB, which is less than the SEIR method of ±0.5LSB,and less than the histogram method of ±0.3LSB. About 20 million samples are required in the proposed method, which is about 30 times less than the traditional histogram method.


Author(s):  
M.N. Ericson ◽  
M. Bobrek ◽  
A. Bobrek ◽  
C.L. Britton ◽  
J.M. Rochelle ◽  
...  

2012 ◽  
Vol 16 (1) ◽  
pp. 28-33 ◽  
Author(s):  
Chul-Kyu Park ◽  
Ki-Chang Jang ◽  
Sun-Sik Woo ◽  
Joong-Ho Choi

2020 ◽  
Vol 63 (11) ◽  
pp. 586-595
Author(s):  
Alexander Korotkov ◽  
Dmitry Morozov ◽  
Mikhail Pilipko ◽  
Mikhail Yenuchenko

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