Build-in-Self-Test of FPGA for diagnosis of delay fault

2011 ◽  
Author(s):  
Nachiketa Das ◽  
Pranab Roy ◽  
Hafizur Rahaman ◽  
Parthasarathi Dasgupta
Keyword(s):  
Delay Fault ◽  
Self Test

An efficient built-in self test method for robust path delay fault testing

1996 ◽  
Vol 8 (2) ◽  
pp. 219-222 ◽  
Author(s):  
Ioannis Voyiatzis ◽  
Antonis Paschalis ◽  
Dimitrios Nikolos ◽  
Constantin Halatsis
Keyword(s):  
Test Method ◽  
Path Delay ◽  
Fault Testing ◽  
Delay Fault ◽  
Delay Fault Testing ◽  
Path Delay Fault ◽  
Self Test ◽  
Path Delay Fault Testing ◽  
Built In Self Test

Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing

2016 ◽  
Vol E99.C (10) ◽  
pp. 1219-1225
Author(s):  
Masahiro ISHIDA ◽  
Toru NAKURA ◽  
Takashi KUSAKA ◽  
Satoshi KOMATSU ◽  
Kunihiro ASADA
Keyword(s):  
Power Supply ◽  
Supply Voltage ◽  
Voltage Control ◽  
Fault Testing ◽  
Power Supply Voltage ◽  
Delay Fault ◽  
Delay Fault Testing

Memory Implementation in a System on Chip with Built-in Self-Test and Recovery Tools

2019 ◽  
Vol 24 (3) ◽  
pp. 239-247
Author(s):  
Vladimir G. Ryabtsev ◽  
◽  
Sergey V. Volobuev ◽  
Keyword(s):  
System On Chip ◽  
Self Test ◽  
Built In Self Test ◽  
On Chip ◽  
Recovery Tools

RF Phase Error Built-In-Self-Test for A GSM SOC

2008 ◽  
Vol 1 (4) ◽  
pp. 39-44
Author(s):  
Dallas Webster ◽  
Loi Phan ◽  
Oren Eliezer ◽  
Rick Hudgens ◽  
Donald Lie
Keyword(s):  
Phase Error ◽  
Self Test ◽  
Built In Self Test
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