Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)
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Published By IEEE Comput. Soc

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LFSR/SR pseudoexhaustive TPG in fewer test cycles

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802878 ◽

2003 ◽

Author(s):

D. Kagaris ◽

S. Tragoudas

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Charge sharing fault detection for CMOS domino logic circuits

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802872 ◽

2003 ◽

Cited By ~ 8

Author(s):

C.H. Cheng ◽

S.C. Chang ◽

J.S. Wang ◽

W.B. Jone

Keyword(s):

Fault Detection ◽

Logic Circuits ◽

Charge Sharing ◽

Domino Logic

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A zero aliasing built-in self test technique for delay fault testing

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802874 ◽

2003 ◽

Cited By ~ 3

Author(s):

Y. Tsiatouhas ◽

T. Haniotakis

Keyword(s):

Fault Testing ◽

Test Technique ◽

Delay Fault ◽

Delay Fault Testing ◽

Self Test ◽

Built In Self Test

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Fast signature simulation for PPSFP simulators

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802884 ◽

2003 ◽

Author(s):

F. Khadour ◽

Xiaoling Sun

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Erasure error correction with hardware detection

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802896 ◽

2003 ◽

Cited By ~ 2

Author(s):

W.D. Armitage ◽

Jien-Chung Lo

Keyword(s):

Error Correction

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Determination of yield bounds prior to routing

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802863 ◽

2003 ◽

Cited By ~ 8

Author(s):

A. Venkataraman ◽

I. Koren

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Testable and fault tolerant design for FFT networks

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802886 ◽

2003 ◽

Author(s):

Jin-Fu Li ◽

Cheng-Wen Wu

Keyword(s):

Fault Tolerant ◽

Fault Tolerant Design

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Power consumption in fast dividers using time shared TMR

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802892 ◽

2003 ◽

Cited By ~ 2

Author(s):

W.L. Gallagher ◽

E.E. Swartzlander

Keyword(s):

Power Consumption

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A methodology for efficient simulation and diagnosis of mixed-signal systems using error waveforms

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802903 ◽

2003 ◽

Author(s):

S. Cherubal ◽

A. Chatterjee

Keyword(s):

Mixed Signal ◽

Efficient Simulation ◽

Signal Systems

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Fault-tolerant refresh power reduction of DRAMs for quasi-nonvolatile data retention

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802898 ◽

2003 ◽

Cited By ~ 16

Author(s):

Y. Katayama ◽

E.J. Stuckey ◽

S. Morioka ◽

Z. Wu

Keyword(s):

Fault Tolerant ◽

Power Reduction ◽

Data Retention

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Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc

LFSR/SR pseudoexhaustive TPG in fewer test cycles

Charge sharing fault detection for CMOS domino logic circuits

A zero aliasing built-in self test technique for delay fault testing

Fast signature simulation for PPSFP simulators

Erasure error correction with hardware detection

Determination of yield bounds prior to routing

Testable and fault tolerant design for FFT networks

Power consumption in fast dividers using time shared TMR

A methodology for efficient simulation and diagnosis of mixed-signal systems using error waveforms

Fault-tolerant refresh power reduction of DRAMs for quasi-nonvolatile data retention

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)
Latest Publications