Degradation of Elevated-Metal Metal-Oxide Thin-Film Transistors Under AC Bias Stress

2018 ◽  
Author(s):  
Yilin Yang ◽  
Xiangyuan Yin ◽  
Mingxiang Wang ◽  
Dongli Zhang
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Bias Stress ◽  
Metal Metal ◽  
Metal Oxide Thin Film

Characteristics of Elevated-Metal Metal-Oxide Thin-Film Transistors Based on Indium-Tin-Zinc Oxide

2017 ◽  
Vol 38 (7) ◽  
pp. 894-897 ◽  
Author(s):  
Zhihe Xia ◽  
Lei Lu ◽  
Jiapeng Li ◽  
Zhuoqun Feng ◽  
Sunbin Deng ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Metal Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Metal Metal ◽  
Metal Oxide Thin Film

Enhanced stability against bias-stress of metal-oxide thin film transistors deposited at elevated temperatures

2011 ◽  
Vol 99 (12) ◽  
pp. 123503 ◽  
Author(s):  
M. Fakhri ◽  
P. Görrn ◽  
T. Weimann ◽  
P. Hinze ◽  
T. Riedl
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Thin Film Transistors ◽  
Elevated Temperatures ◽  
Oxide Thin Film ◽  
Bias Stress ◽  
Metal Oxide Thin Film ◽  
Enhanced Stability

Suppressed Degradation of Elevated-Metal Metal–Oxide Thin-Film Transistors Under Bipolar Gate Pulse Stress

2018 ◽  
Vol 39 (5) ◽  
pp. 707-710 ◽  
Author(s):  
Yilin Yang ◽  
Dongli Zhang ◽  
Mingxiang Wang ◽  
Lei Lu ◽  
Man Wong
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Gate Pulse ◽  
Metal Metal ◽  
Metal Oxide Thin Film
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