Light-Illumination-Induced Degradation in Elevated-Metal Metal-Oxide Thin-Film Transistors without and with Fluorination
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
2017 ◽
Vol 38
(7)
◽
pp. 894-897
◽
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
2018 ◽
Vol 39
(5)
◽
pp. 707-710
◽
Keyword(s):
2018 ◽
Vol 49
(1)
◽
pp. 1235-1238
◽
Keyword(s):