Incorporation of hard-fault-coverage in model-based testing of mixed-signal ICs

Author(s):  
C. Wegener ◽  
M.P. Kennedy
2011 ◽  
Vol 34 (6) ◽  
pp. 1012-1028 ◽  
Author(s):  
Huai-Kou MIAO ◽  
Sheng-Bo CHEN ◽  
Hong-Wei ZENG

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