Virtual metrology for TSV etch depth measurement using optical emission spectroscopy

2015 ◽  
Author(s):  
Ja Myung Gu ◽  
Sang Jeen Hong
Keyword(s):  
Emission Spectroscopy ◽  
Optical Emission Spectroscopy ◽  
Optical Emission ◽  
Etch Depth ◽  
Depth Measurement ◽  
Virtual Metrology

Inductively coupled plasma optical emission spectroscopy as a tool for evaluating lateral flow assays

2021 ◽  
Author(s):  
Jenna M. DeSousa ◽  
Micaella Z. Jorge ◽  
Hayley B. Lindsay ◽  
Frederick R. Haselton ◽  
David W. Wright ◽  
...  
Keyword(s):  
Inductively Coupled Plasma ◽  
Emission Spectroscopy ◽  
Optical Emission Spectroscopy ◽  
Optical Emission ◽  
Lateral Flow ◽  
Gold Content ◽  
Icp Oes ◽  
Inductively Coupled ◽  
Lateral Flow Assays ◽  
Plasma Optical Emission Spectroscopy

This work demonstrates the first use of ICP-OES to quantitatively analyze gold content on lateral flow assays.

Seasoning Optimization by Using Optical Emission Spectroscopy

2020 ◽  
Author(s):  
Masahiro Shiga ◽  
Haruki Omine ◽  
Masaki Kitsunezuka ◽  
Hironori Moki ◽  
Yuki Kataoka ◽  
...  
Keyword(s):  
Emission Spectroscopy ◽  
Optical Emission Spectroscopy ◽  
Optical Emission
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