PCA-based parametric fault analysis for analog integrated circuits

2009 ◽  
Author(s):  
Yong Deng ◽  
Yibing Shi ◽  
Longfu Zhou
Keyword(s):  
Integrated Circuits ◽  
Analog Integrated Circuits ◽  
Fault Analysis ◽  
Parametric Fault

Failure Analysis of Short Faults on Advanced Wire-Bond and Flip-Chip Packages with Scanning SQUID Microscopy

2004 ◽  
Author(s):  
Steve K. Hsiung ◽  
Kevan V. Tan ◽  
Andrew J. Komrowski ◽  
Daniel J. D. Sullivan ◽  
Jan Gaudestad
Keyword(s):  
Magnetic Fields ◽  
Integrated Circuits ◽  
Quantum Interference ◽  
Flip Chip ◽  
Infrared Emission ◽  
Fault Analysis ◽  
Wire Bond ◽  
Overlay Design ◽  
Scanning Squid ◽  
Metal Layers

Abstract Scanning SQUID (Superconducting Quantum Interference Device) Microscopy, known as SSM, is a non-destructive technique that detects magnetic fields in Integrated Circuits (IC). The magnetic field, when converted to current density via Fast Fourier Transform (FFT), is particularly useful to detect shorts and high resistance (HR) defects. A short between two wires or layers will cause the current to diverge from the path the designer intended. An analyst can see where the current is not matching the design, thereby easily localizing the fault. Many defects occur between or under metal layers that make it impossible using visible light or infrared emission detecting equipment to locate the defect. SSM is the only tool that can detect signals from defects under metal layers, since magnetic fields are not affected by them. New analysis software makes it possible for the analyst to overlay design layouts, such as CAD Knights, directly onto the current paths found by the SSM. In this paper, we present four case studies where SSM successfully localized short faults in advanced wire-bond and flip-chip packages after other fault analysis methods failed to locate the defects.

scholarly journals Efficient symbolic computation of approximated small-signal characteristics of analog integrated circuits

1995 ◽  
Vol 30 (3) ◽  
pp. 327-330 ◽  
Author(s):  
P. Wambacq ◽  
F.V. Fernandez ◽  
G. Gielen ◽  
W. Sansen ◽  
A. Rodriguez-Vazquez
Keyword(s):  
Integrated Circuits ◽  
Symbolic Computation ◽  
Analog Integrated Circuits ◽  
Small Signal ◽  
Signal Characteristics

Systematic design of analog integrated circuits using ant colony algorithm based on noise optimization

2015 ◽  
Vol 86 (2) ◽  
pp. 327-339 ◽  
Author(s):  
Meysam Akbari ◽  
Mohammad Shokouhifar ◽  
Omid Hashemipour ◽  
Ali Jalali ◽  
Alireza Hassanzadeh
Keyword(s):  
Integrated Circuits ◽  
Ant Colony Algorithm ◽  
Analog Integrated Circuits ◽  
Ant Colony ◽  
Systematic Design ◽  
Noise Optimization
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