A generalized Holland model for wave diffraction by thin wires

2007 ◽  
Author(s):  
X. Claeys ◽  
F. Collino
Keyword(s):  
Wave Diffraction ◽  
Thin Wires ◽  
Holland Model

Improvements on the gaseous detector device

1986 ◽  
Vol 44 ◽  
pp. 630-631 ◽  
Author(s):  
G.D. Danilatos
Keyword(s):  
Gaseous Medium ◽  
The Other ◽  
Beam Specimen ◽  
Thin Wires ◽  
Interference Noise ◽  
Backscattered Electron ◽  
Detection Of Signals ◽  
Environmental Sem

The possibility of placing the specimen in a gaseous medium in the environmental SEM (ESEM) has created novel ways for detection of signals from the beam-specimen interactions. It was originally reported by Oanilatos that the ionization produced by certain signals inside the conditioning medium can be used to produce images. The aim of this report is to demonstrate some of the improvements on the system that have occurred thereafter.Two straight thin wires are aligned horizontally along a direction normal to the direction of the two scintillator backscattered electron (BSE) detectors reported elsewhere. The free end tips of the wires are about 5 mm apart halfway between the specimen and the pressure limiting aperture (specimen distance = 1.5 mm). The other end of each wire makes contact with the input of a separate preamplifier, two of which are built inside a shielding aluminum stub. With such a design, interference noise from the input cables is avoided.

Standing wave diffraction with a beam of slow atoms

1997 ◽  
Vol 44 (10) ◽  
pp. 1863-1882 ◽  
Author(s):  
S. KUNZE , S. DURR, K. DIECKMANN , M.
Keyword(s):  
Standing Wave ◽  
Wave Diffraction

A SEMI-ANALYTICAL METHOD FOR SOLVING INVERSE PROBLEMS OF WAVE DIFFRACTION BY INHOMOGENEOUS LAYERS

2015 ◽  
Vol 74 (11) ◽  
pp. 945-969 ◽  
Author(s):  
A. V. Brovenko ◽  
N.P. Melezhik ◽  
P. N. Melezhik ◽  
A.Yu. Poyedinchuk ◽  
Alexey A. Vertiy
Keyword(s):  
Inverse Problems ◽  
Wave Diffraction ◽  
Analytical Method

SH-Wave Scattering From the Interface Defect

2017 ◽  
Vol 5 (1) ◽  
pp. 45-50
Author(s):  
Myron Voytko ◽  
◽  
Yaroslav Kulynych ◽  
Dozyslav Kuryliak
Keyword(s):  
Half Space ◽  
Wave Diffraction ◽  
Scattered Field ◽  
Wave Scattering ◽  
Elastic Layer ◽  
Analytical Form ◽  
Structure Parameters ◽  
Sh Wave ◽  
Interface Defect ◽  
Hopf Method

The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.

Studies of Millimeter-Wave Diffraction Devices and Materials. Phase III.

1986 ◽  
Author(s):  
Eugene R. Leach ◽  
Milton R. Seiler ◽  
Jennifer I. Halman
Keyword(s):  
Millimeter Wave ◽  
Wave Diffraction ◽  
Phase Iii
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