Properties of TiN films deposited by atomic layer deposition for through silicon via applications

Author(s):  
Wenjie Zhang ◽  
Jian Cai ◽  
Dejun Wang ◽  
Qian Wang ◽  
Shuidi Wang
2014 ◽  
Vol 19 (2) ◽  
pp. 144-149 ◽  
Author(s):  
Siyi Xie ◽  
Jian Cai ◽  
Qian Wang ◽  
Lu Wang ◽  
Ziyu Liu

2018 ◽  
Vol 36 (5) ◽  
pp. 051505 ◽  
Author(s):  
Igor Krylov ◽  
Ekaterina Zoubenko ◽  
Kamira Weinfeld ◽  
Yaron Kauffmann ◽  
Xianbin Xu ◽  
...  

2014 ◽  
Vol 556 ◽  
pp. 560-565 ◽  
Author(s):  
Kyeong-Keun Choi ◽  
Jong Kee ◽  
Si-Hong Kim ◽  
Myung-Soo Park ◽  
Chan-Gyung Park ◽  
...  

2006 ◽  
Vol 100 (2) ◽  
pp. 023534 ◽  
Author(s):  
E. Langereis ◽  
S. B. S. Heil ◽  
M. C. M. van de Sanden ◽  
W. M. M. Kessels

2012 ◽  
Vol 1 (6) ◽  
pp. P285-P290 ◽  
Author(s):  
H. Van Bui ◽  
A. Y. Kovalgin ◽  
R. A. M. Wolters

Sign in / Sign up

Export Citation Format

Share Document