Fuzzy Solution of Uncertainty Problems in Multi-objective Optimization of Accelerated Degradation Test Design

2018 1st IEEE International Conference on Knowledge Innovation and Invention (ICKII) ◽

10.1109/ickii.2018.8569121 ◽

2018 ◽

Author(s):

Wang Xiaohong ◽

Fan Wenhui ◽

Wang Lizhi

Keyword(s):

Test Design ◽

Multi Objective Optimization ◽

Multi Objective ◽

Accelerated Degradation ◽

Fuzzy Solution ◽

Degradation Test ◽

Accelerated Degradation Test

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Multi-Objective Optimization Design of Constant Stress Accelerated Degradation Test Using Inverse Gaussian Process

IEEE Access ◽

10.1109/access.2019.2900397 ◽

2019 ◽

Vol 7 ◽

pp. 28757-28768 ◽

Cited By ~ 3

Author(s):

Zhenyu Wu ◽

Xiaoping Liu ◽

Bin Guo ◽

Dejun Cui ◽

Lijie Zhang

Keyword(s):

Gaussian Process ◽

Optimization Design ◽

Constant Stress ◽

Inverse Gaussian ◽

Multi Objective Optimization ◽

Multi Objective ◽

Accelerated Degradation ◽

Inverse Gaussian Process ◽

Degradation Test ◽

Accelerated Degradation Test

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Multi-objective optimization design of accelerated degradation test based on Wiener process

Communication in Statistics- Theory and Methods ◽

10.1080/03610926.2020.1764043 ◽

2020 ◽

pp. 1-18

Author(s):

Xiaoping Liu ◽

Bin Guo ◽

Lijian Xia ◽

Xiao Tian ◽

Lijie Zhang

Keyword(s):

Wiener Process ◽

Optimization Design ◽

Multi Objective Optimization ◽

Multi Objective ◽

Accelerated Degradation ◽

Degradation Test ◽

Accelerated Degradation Test

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A novel accelerated degradation test design considering stress optimization

Cluster Computing ◽

10.1007/s10586-018-1970-0 ◽

2018 ◽

Vol 22 (S4) ◽

pp. 8793-8802

Author(s):

Dayong Shen ◽

Tianyu Liu ◽

Longfei Zhang ◽

Jie Wang ◽

Yumeng Liu

Keyword(s):

Test Design ◽

Accelerated Degradation ◽

Stress Optimization ◽

Degradation Test ◽

Accelerated Degradation Test

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Modified Bayesian D-Optimality for Accelerated Degradation Test Design With Model Uncertainty

IEEE Access ◽

10.1109/access.2019.2906914 ◽

2019 ◽

Vol 7 ◽

pp. 42181-42189 ◽

Cited By ~ 1

Author(s):

Yong Yu ◽

Changhua Hu ◽

Xiaosheng Si ◽

Jianxun Zhang

Keyword(s):

Model Uncertainty ◽

Test Design ◽

Accelerated Degradation ◽

Degradation Test ◽

Accelerated Degradation Test

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Accelerated Degradation Test Design and Degradation Trajectory Prediction of Radar Gain Control Module

10.1109/phm-nanjing52125.2021.9613016 ◽

2021 ◽

Author(s):

Hongda Sun ◽

Bo Jing ◽

Shenglong Wang ◽

Jie Bao ◽

Yu Zhang ◽

...

Keyword(s):

Gain Control ◽

Test Design ◽

Trajectory Prediction ◽

Control Module ◽

Accelerated Degradation ◽

Degradation Test ◽

Accelerated Degradation Test

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A novel optimal accelerated degradation test design method considering multiple decision variables

Microelectronics Reliability ◽

10.1016/j.microrel.2021.114334 ◽

2021 ◽

Vol 124 ◽

pp. 114334

Author(s):

Zhihua Wang ◽

Gen Liu ◽

Wenbo Li ◽

Qiong Wu ◽

Junxing Li ◽

...

Keyword(s):

Design Method ◽

Test Design ◽

Accelerated Degradation ◽

Decision Variables ◽

Degradation Test ◽

Accelerated Degradation Test

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Development of Reliability Acceptance Sampling Plan for the Case where the Degradation Quantity of the Performance Characteristic Follows Weibull Distribution based on the Accelerated Degradation Test

Journal of Applied Reliability ◽

10.33162/jar.2018.06.18.2.122 ◽

2018 ◽

Vol 18 (2) ◽

pp. 122-129

Author(s):

Heonsang Lim ◽

Jaehun Park ◽

Si-Il Sung

Keyword(s):

Weibull Distribution ◽

Performance Characteristic ◽

Sampling Plan ◽

Acceptance Sampling ◽

Accelerated Degradation ◽

Acceptance Sampling Plan ◽

Degradation Test ◽

Accelerated Degradation Test

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Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning

IEEE Transactions on Reliability ◽

10.1109/tr.2019.2955596 ◽

2020 ◽

Vol 69 (3) ◽

pp. 887-902

Author(s):

Zhen Chen ◽

Tangbin Xia ◽

Yanting Li ◽

Ershun Pan

Keyword(s):

Test Planning ◽

Accelerated Degradation ◽

Degradation Modeling ◽

Degradation Test ◽

Accelerated Degradation Test

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In-situ electrochemical atomic force microscopy study of aging of magnetron sputtered Pt-Co nanoalloy thin films during accelerated degradation test

Electrochimica Acta ◽

10.1016/j.electacta.2016.06.035 ◽

2016 ◽

Vol 211 ◽

pp. 52-58 ◽

Cited By ~ 17

Author(s):

Ivan Khalakhan ◽

Mykhailo Vorokhta ◽

Michal Václavů ◽

Břetislav Šmíd ◽

Jaroslava Lavková ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Accelerated Degradation ◽

Atomic Force ◽

Degradation Test ◽

Accelerated Degradation Test

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Design Optimization for the Step-Stress Accelerated Degradation Test under Tweedie Exponential Dispersion Process

10.3850/978-981-18-2016-8_692-cd ◽

2021 ◽

Author(s):

David Han

Keyword(s):

Design Optimization ◽

Dispersion Process ◽

Accelerated Degradation ◽

Degradation Test ◽

Accelerated Degradation Test

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