Controllability of flatband voltage in high-k gate stack structures - remarkable advantages of La/sub 2/O/sub 3/ over HfO/sub 2/

Author(s):  
K. Ohmori ◽  
P. Ahmet ◽  
K. Shiraishi ◽  
K. Yamabe ◽  
H. Watanabe ◽  
...  
Keyword(s):  
High K ◽  
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