Improving the Brightness and Reliability of InGaN/GaN Near Ultraviolet Light-Emitting Diodes by Controlling the Morphology of the GaN Buffer Layer
2016 ◽
Vol 12
(8)
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pp. 869-872
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2019 ◽
Vol 471
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pp. 231-238
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2017 ◽
Vol 214
(6)
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pp. 1600714
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2017 ◽
Vol 34
(7)
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pp. 074210
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2011 ◽
Vol 14
(11)
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pp. H438
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2019 ◽
Vol 55
(5)
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pp. 1-7
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2013 ◽
Vol 52
(8S)
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pp. 08JL17
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2007 ◽
Vol 4
(7)
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pp. 2646-2649
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