Trap Density of States Measured by Photon Probe on Amorphous-InGaZnO Thin-Film Transistors
2011 ◽
Vol 32
(3)
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pp. 336-338
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2012 ◽
Vol 29
(6)
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pp. 067302
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2012 ◽
Vol 33
(7)
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pp. 1015-1017
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2012 ◽
Vol 59
(10)
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pp. 2689-2698
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2010 ◽
Vol 31
(3)
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pp. 231-233
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2010 ◽
Vol 157
(3)
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pp. H272
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2014 ◽
Vol 14
(12)
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pp. 1713-1717
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