Built-in self-test approaches for analogue and mixed-signal integrated circuits

38th Midwest Symposium on Circuits and Systems. Proceedings ◽

10.1109/mwscas.1995.510298 ◽

2002 ◽

Author(s):

S. Mir ◽

M. Lubaszewski ◽

V. Liberali ◽

B. Courtois

Keyword(s):

Integrated Circuits ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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Analog signal generation for built-in self-test of mixed-signal integrated circuits

Microelectronics Journal ◽

10.1016/s0026-2692(96)90016-6 ◽

1996 ◽

Vol 27 (1) ◽

pp. 103-104

Author(s):

S.L. Hurst

Keyword(s):

Integrated Circuits ◽

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits

10.1007/978-1-4615-2341-3 ◽

1995 ◽

Author(s):

Gordon W. Roberts ◽

Albert K. Lu

Keyword(s):

Integrated Circuits ◽

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639692 ◽

2002 ◽

Author(s):

K. Arabi ◽

B. Kaminska

Keyword(s):

Integrated Circuits ◽

Structural Testing ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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Modular Testing and Built-In Self-Test of Embedded Cores in System-on-Chip Integrated Circuits

Embedded Systems Handbook - Industrial Information Technology ◽

10.1201/9781420038163.ch27 ◽

2005 ◽

pp. 27-1-27-27

Author(s):

Krishnendu Chakrabarty

Keyword(s):

Integrated Circuits ◽

System On Chip ◽

Embedded Cores ◽

Self Test ◽

Built In Self Test ◽

On Chip ◽

Modular Testing

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Towards built-in-self-test for SNR testing of a mixed-signal IC

1993 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.1993.692969 ◽

2005 ◽

Author(s):

M.P. Toner ◽

G.W. Roberts

Keyword(s):

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Mixed Signal Ic

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On-chip analog signal generation for mixed-signal built-in self-test

IEEE Journal of Solid-State Circuits ◽

10.1109/4.748183 ◽

1999 ◽

Vol 34 (3) ◽

pp. 318-330 ◽

Author(s):

B. Dufort ◽

G.W. Roberts

Keyword(s):

Analog Signal ◽

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

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Arbitrary-precision signal generation for mixed-signal built-in-self-test

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ◽

10.1109/82.735354 ◽

1998 ◽

Vol 45 (11) ◽

pp. 1425-1432 ◽

Author(s):

X. Haurie ◽

G.W. Roberts

Keyword(s):

Signal Generation ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

Arbitrary Precision

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A mixed-signal built-in self-test approach for analog circuits

Southwest Symposium on Mixed-Signal Design, 2003. ◽

10.1109/ssmsd.2003.1190426 ◽

2003 ◽

Author(s):

C. Stroud ◽

J. Morton ◽

T. Islam ◽

H. Alassaly

Keyword(s):

Analog Circuits ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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VDDQ: a built-in self-test scheme for analog on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) ◽

10.1109/iccdcs.2002.1004083 ◽

2003 ◽

Author(s):

G.O.D. Acevedo ◽

J. Ramirez-Angulo

Keyword(s):

Test Scheme ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test ◽

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Built-in self-test and self-calibration for analog and mixed signal circuits

2019 IEEE International Test Conference (ITC) ◽

10.1109/itc44170.2019.9000120 ◽

2019 ◽

Author(s):

Tao Chen ◽

Degang Chen

Keyword(s):

Mixed Signal ◽

Self Calibration ◽

Mixed Signal Circuits ◽

Self Test ◽

Built In Self Test

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