Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits
Keyword(s):
Keyword(s):
1999 ◽
Vol 34
(3)
◽
pp. 318-330
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Keyword(s):
1998 ◽
Vol 45
(11)
◽
pp. 1425-1432
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