Microwave characterization of heterogeneous materials in transmission lines: a model with resonators

2002 ◽  
Author(s):  
S. Lefrancois ◽  
D. Pasquet ◽  
G. Maze-Merceur
Keyword(s):  
Transmission Lines ◽  
Heterogeneous Materials ◽  
Microwave Characterization

High-power InAlAs/InGaAs Schottky barrier photodiodes for analog microwave signal transmission

2022 ◽  
Vol 43 (1) ◽  
pp. 012302
Author(s):  
K. S. Zhuravlev ◽  
A. L. Chizh ◽  
K. B. Mikitchuk ◽  
A. M. Gilinsky ◽  
I. B. Chistokhin ◽  
...  
Keyword(s):  
Schottky Barrier ◽  
Transmission Lines ◽  
High Power ◽  
High Speed ◽  
Signal Transmission ◽  
Mesa Structure ◽  
Microwave Characterization ◽  
Absorbing Layer ◽  
Analog Transmission

Abstract The design, manufacturing and DC and microwave characterization of high-power Schottky barrier InAlAs/InGaAs back-illuminated mesa structure photodiodes are presented. The photodiodes with 10 and 15 μm mesa diameters operate at ≥40 and 28 GHz, respectively, have the output RF power as high as 58 mW at a frequency of 20 GHz, the DC responsivity of up to 1.08 A/W depending on the absorbing layer thickness, and a photodiode dark current as low as 0.04 nA. We show that these photodiodes provide an advantage in the amplitude-to-phase conversion factor which makes them suitable for use in high-speed analog transmission lines with stringent requirements for phase noise.

Fabrication and Microwave Characterization of 3-D Printed Transmission Lines

2015 ◽  
Vol 25 (12) ◽  
pp. 823-825 ◽  
Author(s):  
Paul I. Deffenbaugh ◽  
Thomas M. Weller ◽  
Kenneth H. Church
Keyword(s):  
Transmission Lines ◽  
Microwave Characterization

Microwave Characterization Techniques for High K Thin Films

2009 ◽  
Vol 421-422 ◽  
pp. 73-76
Author(s):  
K. Sudheendran ◽  
K.C. James Raju
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Transmission Lines ◽  
Coplanar Waveguide ◽  
Measurement Techniques ◽  
Microwave Dielectric Properties ◽  
Microwave Frequency ◽  
Characterization Techniques ◽  
Microwave Characterization

Characterization of the dielectric properties of bulk materials in the microwave frequency range is well developed while that of thin films is a challenge. New microwave characterization techniques are needed for thin films taking in to account the fact that they are always deposited on a dielectric or conducting substrate and the thickness of the film is too small compared to the wavelength involved. In this paper we are demonstrating various techniques that can be used for the microwave characterization of thin films. The microwave dielectric properties of the bismuth zinc niobate (BZN) thin films were characterized at different frequencies using a few techniques by involving coplanar waveguide (CPW) transmission lines circular patch capacitors and split post dielectric resonators. The first two are broadband measurement techniques while the third one is a spot frequency technique.

Microwave characterization of a double-barrier GaAs/AlAs resonant tunneling diodes for active microstrip transmission lines

2021 ◽  
Vol 60 (08) ◽  
Author(s):  
Alexander S. Sobolev ◽  
Sergey V. Zaitsev-Zotov ◽  
Maxim V. Maytama ◽  
Evgenyi A. Klimov ◽  
Alexander Y. Pavlov ◽  
...  
Keyword(s):  
Transmission Lines ◽  
Resonant Tunneling ◽  
Resonant Tunneling Diodes ◽  
Double Barrier ◽  
Tunneling Diodes ◽  
Microwave Characterization ◽  
Microstrip Transmission Lines

Cryogenic on-wafer microwave characterization of GaAs MESFETs and superconducting coplanar resonance and transmission lines structures

1994 ◽  
Author(s):  
Jay Kruse ◽  
Ralph A. Schweinfurth ◽  
Feng Gao ◽  
Dan Scherrer ◽  
D. Barlage ◽  
...  
Keyword(s):  
Transmission Lines ◽  
Microwave Characterization
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