Transmission Electron Microscopy Study on Degradation Mechanism of CdTe Thin-Film Solar Cells

Degradation Mechanism ◽

Microscopy Study ◽

Thin Film Solar Cells ◽

Cdte Thin Film ◽

Transmission electron microscopy study of microstructure and fine a, b-axis-oriented grains as flux-pinning centers in c-axis-oriented GdBa2Cu3O7 − x thin film

Physica C Superconductivity ◽

10.1016/0921-4534(94)90400-6 ◽

1994 ◽

Vol 219 (3-4) ◽

pp. 457-464 ◽

Cited By ~ 5

Author(s):

W.L. Zhou ◽

C.A. Wang ◽

K.K. Fung ◽

Y.Q. Zhou ◽

R.L. Wang ◽

...

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Flux Pinning ◽

Microscopy Study ◽

Pinning Centers ◽

Field-emission transmission electron microscopy study of the reaction sequence between Sn–Ag–Cu alloy and an amorphous Pd(P) thin film in microelectronic packaging

Thin Solid Films ◽

10.1016/j.tsf.2012.07.076 ◽

2013 ◽

Vol 529 ◽

pp. 369-373 ◽

Cited By ~ 10

Author(s):

C.E. Ho ◽

C.C. Wang ◽

M.A. Rahman ◽

Y.C. Lin

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Microscopy Study ◽

Microelectronic Packaging ◽

Reaction Sequence ◽

Cu Alloy ◽

A transmission electron microscopy study of intermetallic formation in aluminium-copper thin-film couples

Journal of Crystal Growth ◽

10.1016/0022-0248(80)90164-5 ◽

1980 ◽

Vol 49 (2) ◽

pp. 297-302 ◽

Cited By ~ 41

Author(s):

K. Rajan ◽

E.R. Wallach

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Microscopy Study ◽

Copper Thin Film ◽

Intermetallic Formation ◽

Transmission Electron ◽

Aluminium Copper

High resolution and analytical transmission electron microscopy study of growth processes in a YBCO thin film

Journal of Materials Science Letters ◽

10.1007/bf00586174 ◽

1995 ◽

Vol 14 (9) ◽

pp. 670-673 ◽

Cited By ~ 6

Author(s):

Y. H. Li ◽

C. Leach ◽

P. Quincey

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Analytical Transmission Electron Microscopy ◽

Ybco Thin Film ◽

Transmission electron microscopy study of fine a-axis-oriented grains as flux-pinning centers in YBa2Cu3O7-x/ZrO2(Y) thin film

Physica C Superconductivity ◽

10.1016/0921-4534(94)91523-7 ◽

1994 ◽

Vol 235-240 ◽

pp. 599-600

Author(s):

W.L. Zhou ◽

C.A. Wang ◽

K.K. Fung ◽

H.C. Li ◽

L. Li

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Flux Pinning ◽

Microscopy Study ◽

Pinning Centers ◽

High Resolution Transmission Electron Microscopy Study of Multi-Walled Carbon Nanotubes Growth on Manganese Oxide Thin Film

Science of Advanced Materials ◽

10.1166/sam.2015.2176 ◽

2015 ◽

Vol 7 (6) ◽

pp. 1045-1052

Author(s):

A. M. Valenzuela-Muñiz ◽

Y. Verde-Gómez ◽

P. Amézaga-Madrid ◽

G. Alonso-Nuñez ◽

M. Miki-Yoshida

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Microscopy Study ◽

Oxide Thin Film ◽

Transmission Electron ◽

Multi Walled Carbon Nanotubes ◽

Walled Carbon Nanotubes

Effect of Operating Conditions on the Degradation Mechanism of Pt3Co Nanocatalysts in PEM Fuel Cells- a Transmission Electron Microscopy Study

Microscopy and Microanalysis ◽

10.1017/s1431927613010507 ◽

2013 ◽

Vol 19 (S2) ◽

pp. 1702-1703

Author(s):

S. Rasouli ◽

D.J. Myers ◽

S. Ball ◽

M. Gummalla ◽

P.J. Ferreira

Keyword(s):

Electron Microscopy ◽

Fuel Cells ◽

Degradation Mechanism ◽

Microscopy Study ◽

Pem Fuel Cells ◽

Operating Conditions ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A transmission electron microscopy study of rf‐ and dc‐magnetron‐sputtered thin film chromium and chromium–platinum coatings

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.572800 ◽

1985 ◽

Vol 3 (6) ◽

pp. 2623-2626 ◽

Cited By ~ 4

Author(s):

M. R. Fishkis ◽

R. D. Sisson ◽

R. R. Biederman

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Microscopy Study ◽

Misfit accommodation mechanisms at moving reaction fronts during topotaxial spinel-forming thin-film solid-state reactions: A high-resolution transmission electron microscopy study of five spinels of different misfits

Philosophical Magazine A ◽

10.1080/01418619708214000 ◽

1997 ◽

Vol 75 (4) ◽

pp. 889-908 ◽

Cited By ~ 35

Author(s):

H. Sieber ◽

D. Hess ◽

P. Werner

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Microscopy Study ◽

Solid State Reactions ◽

Reaction Fronts ◽

Transmission Electron ◽

Misfit Accommodation

Transmission Electron Microscopy Study of Defect Structure in Epitaxial SnO2 Rutile Thin Film.

Journal of the Ceramic Society of Japan ◽

10.2109/jcersj.110.86 ◽

2002 ◽

Vol 110 (1278) ◽

pp. 86-91 ◽

Cited By ~ 6

Author(s):

Toshimasa SUZUKI ◽

Hirotaka WAKABAYASHI ◽

Yuji NISHI ◽

Masayuki FUJIMOTO

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Defect Structure ◽

Microscopy Study ◽