Transmission Electron Microscopy Study of Defect Structure in Epitaxial SnO2 Rutile Thin Film.

2002 ◽  
Vol 110 (1278) ◽  
pp. 86-91 ◽  
Author(s):  
Toshimasa SUZUKI ◽  
Hirotaka WAKABAYASHI ◽  
Yuji NISHI ◽  
Masayuki FUJIMOTO
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