Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAM

1985 ◽  
Vol 32 (6) ◽  
pp. 4164-4169 ◽  
Author(s):  
J. A. Zoutendyk ◽  
L. S. Smith ◽  
G. A. Soli ◽  
P. Thieberger ◽  
H. E. Wegner
Keyword(s):  
Heavy Ions ◽  
Model Verification ◽  
Single Event Upset ◽  
Single Event ◽  
Threshold Determination ◽  
Static Ram

Trends in Parts Susceptibility to Single Event Upset from Heavy Ions

1985 ◽  
Vol 32 (6) ◽  
pp. 4189-4194 ◽  
Author(s):  
Donald K. Nichols ◽  
William E. Price ◽  
W. A. Kolasinski ◽  
R. Koga ◽  
James C. Pickel ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Single Event Upset ◽  
Single Event

Single Event Upset Testing with Relativistic Heavy Ions

1984 ◽  
Vol 31 (6) ◽  
pp. 1559-1561 ◽  
Author(s):  
T. L. Criswell ◽  
P. R. Measel ◽  
K. L. Wahlin
Keyword(s):  
Heavy Ions ◽  
Single Event Upset ◽  
Single Event ◽  
Relativistic Heavy Ions

Impact of temperature on single event upset measurement by heavy ions in SRAM devices

2014 ◽  
Vol 35 (8) ◽  
pp. 084008
Author(s):  
Tianqi Liu ◽  
Chao Geng ◽  
Zhangang Zhang ◽  
Fazhan Zhao ◽  
Song Gu ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Single Event Upset ◽  
Single Event

Single Event Upset Dependence on Temperature or an NMOS/Resistive-Load Static RAM

1986 ◽  
Vol 33 (6) ◽  
pp. 1610-1615 ◽  
Author(s):  
W. J. Stapor ◽  
R. L. Johnson ◽  
M. A. Xapsos ◽  
K. W. Fernald ◽  
A. B. Campbell ◽  
...  
Keyword(s):  
Resistive Load ◽  
Single Event Upset ◽  
Single Event ◽  
Static Ram

scholarly journals Impact of D-Flip-Flop Architectures and Designs on Single-Event Upset Induced by Heavy Ions

2018 ◽  
Vol 65 (8) ◽  
pp. 1776-1782 ◽  
Author(s):  
L. Artola ◽  
G. Hubert ◽  
S. Ducret ◽  
J. Mekki ◽  
Ahmad Al Youssef ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Single Event Upset ◽  
Single Event ◽  
Flip Flop

Empirical Modeling of Single-Event Upset (SEU) in NMOS Depletion-Mode-Load Static RAM (SRAM) Chips

1986 ◽  
Vol 33 (6) ◽  
pp. 1581-1585 ◽  
Author(s):  
J. A. Zoutendyk ◽  
L. S. Smith ◽  
G. A. Soli ◽  
S. L. Smith ◽  
G. E. Atwood ◽  
...  
Keyword(s):  
Empirical Modeling ◽  
Single Event Upset ◽  
Single Event ◽  
Static Ram

Recent Trends in Parts SEU (Single Event Upset) Susceptibility from Heavy Ions.

1988 ◽  
Author(s):  
D. K. Nichols ◽  
L. S. Smith ◽  
W. E. Price ◽  
R. Koga ◽  
W. A. Kolasinski
Keyword(s):  
Heavy Ions ◽  
Single Event Upset ◽  
Single Event ◽  
Recent Trends
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