Investigation of radial dose effect on single event upset cross-section due to heavy ions using GEANT4

2015 ◽  
Vol 78 ◽  
pp. 42-47 ◽  
Author(s):  
S. Boorboor ◽  
S.A.H. Feghhi ◽  
H. Jafari
Keyword(s):  
Cross Section ◽  
Heavy Ions ◽  
Dose Effect ◽  
Single Event Upset ◽  
Single Event ◽  
Radial Dose

Trends in Parts Susceptibility to Single Event Upset from Heavy Ions

1985 ◽  
Vol 32 (6) ◽  
pp. 4189-4194 ◽  
Author(s):  
Donald K. Nichols ◽  
William E. Price ◽  
W. A. Kolasinski ◽  
R. Koga ◽  
James C. Pickel ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Single Event Upset ◽  
Single Event

Acquisition and classification of static single-event upset cross section for SRAM-based FPGAs

2011 ◽  
Vol 23 (3) ◽  
pp. 811-816
Author(s):  
姚志斌 Yao Zhibin ◽  
范如玉 Fan Ruyu ◽  
郭红霞 Guo Hongxia ◽  
王忠明 Wang Zhongming ◽  
何宝平 He Baoping ◽  
...  
Keyword(s):  
Cross Section ◽  
Single Event Upset ◽  
Single Event

Single Event Upset Testing with Relativistic Heavy Ions

1984 ◽  
Vol 31 (6) ◽  
pp. 1559-1561 ◽  
Author(s):  
T. L. Criswell ◽  
P. R. Measel ◽  
K. L. Wahlin
Keyword(s):  
Heavy Ions ◽  
Single Event Upset ◽  
Single Event ◽  
Relativistic Heavy Ions

Impact of temperature on single event upset measurement by heavy ions in SRAM devices

2014 ◽  
Vol 35 (8) ◽  
pp. 084008
Author(s):  
Tianqi Liu ◽  
Chao Geng ◽  
Zhangang Zhang ◽  
Fazhan Zhao ◽  
Song Gu ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Single Event Upset ◽  
Single Event

Modeling the heavy ion cross-section for single event upset with track structure effects: the HIC-UP-TS model

1996 ◽  
Vol 43 (6) ◽  
pp. 2814-2819 ◽  
Author(s):  
L.W. Connell ◽  
F.W. Sexton ◽  
P.J. McDaniel ◽  
A.K. Prinja
Keyword(s):  
Cross Section ◽  
Heavy Ion ◽  
Track Structure ◽  
Single Event Upset ◽  
Single Event

Semi-Empirical Method for Estimation of Single-Event Upset Cross Section for SRAM DICE Cells

2016 ◽  
Vol 63 (4) ◽  
pp. 2250-2256 ◽  
Author(s):  
Maxim S. Gorbunov ◽  
Anna B. Boruzdina ◽  
Pavel S. Dolotov
Keyword(s):  
Cross Section ◽  
Empirical Method ◽  
Single Event Upset ◽  
Single Event ◽  
Semi Empirical

scholarly journals Impact of recombination on heavy ion induced single event upset cross-section

2016 ◽  
Vol 151 ◽  
pp. 012040
Author(s):  
K S Zemtsov ◽  
A M Galimov ◽  
M E Gorchichko ◽  
I V Elushov
Keyword(s):  
Cross Section ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event
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