Single-Event Upset (SEU) in a Dram with On-Chip Error Correction

1987 ◽  
Vol 34 (6) ◽  
pp. 1310-1315 ◽  
Author(s):  
J. A. Zoutendyk ◽  
H. R. Schwartz ◽  
R. K. Watson ◽  
Z. Hasnain ◽  
L. R. Nevill
Keyword(s):  
Error Correction ◽  
Single Event Upset ◽  
Single Event ◽  
On Chip

An Error Correction Code for Use in Space Vehicle Computers

2011 ◽  
Vol 121-126 ◽  
pp. 3784-3788
Author(s):  
R.N. Huang ◽  
B. Gong ◽  
Yun Jiang Lou
Keyword(s):  
Error Correction ◽  
Error Detection ◽  
Efficient Solution ◽  
Space Vehicle ◽  
Space Vehicles ◽  
Memory Cells ◽  
Hamming Code ◽  
Single Event Upset ◽  
Single Event ◽  
Signal Error

Memory cells of space vehicle computers generate errors in their stored data because of radiation. The main reason of the error is single event upset (SEU). Hamming code which has Capability of correcting one bit and detecting two bits is usually used in space vehicles to secure the memory data. As the density of the memory is more and more high, the possibility of multiple bits upset (MBU) increase and hamming code may be inadequate. In this paper, a (15,8) code is presented which can correct all double-adjacent errors and triple-adjacent errors in addition to signal error correction (SEC) and double error detection (DED). It is a powerful and efficient solution to SEU and MBU.

SEU (Single Event Upset) Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors,

1986 ◽  
Author(s):  
R. Koga ◽  
W. A. Kolasinski ◽  
C. King ◽  
J. Cusick
Keyword(s):  
Single Event Upset ◽  
Single Event
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