Observation of Radiation-Induced Leakage Current Defects in MOS Oxides With Multifrequency Electrically Detected Magnetic Resonance and Near-Zero-Field Magnetoresistance
2001 ◽
Vol 308-310
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pp. 1169-1172
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2014 ◽
Vol 778-780
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pp. 414-417
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2011 ◽
Vol 3
(4)
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pp. 568-574
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