Summary Abstract: Characterization of planar aluminas by x‐ray photoelectron and electron energy loss spectroscopy

1985 ◽  
Vol 3 (3) ◽  
pp. 1313-1314 ◽  
Author(s):  
Erik D. Johnson ◽  
Robert P. Merrill
Author(s):  
R. F. Egerton

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.


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